G01Q 70/08
Probe characteristics
G01Q70/08 (Probe characteristics) appears on 496 US grants and 509 published applications in this corpus.
Search patents in G01Q- Granted patents
- 496
- Published applications
- 509
- Assignees
- 284
- Inventors
- 1,140
- Latest grant
- 28 Jul 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1990 | 1 | 0 |
| 1991 | 5 | 0 |
| 1992 | 3 | 0 |
| 1993 | 12 | 0 |
| 1994 | 5 | 0 |
| 1995 | 7 | 0 |
| 1996 | 3 | 0 |
| 1997 | 4 | 0 |
| 1998 | 8 | 0 |
| 1999 | 10 | 0 |
| 2000 | 8 | 0 |
| 2001 | 5 | 4 |
| 2002 | 11 | 23 |
| 2003 | 13 | 28 |
| 2004 | 21 | 26 |
| 2005 | 17 | 27 |
| 2006 | 22 | 28 |
| 2007 | 19 | 40 |
| 2008 | 26 | 23 |
| 2009 | 34 | 23 |
| 2010 | 12 | 32 |
| 2011 | 15 | 14 |
| 2012 | 16 | 17 |
| 2013 | 25 | 13 |
| 2014 | 22 | 17 |
| 2015 | 10 | 10 |
| 2016 | 13 | 11 |
| 2017 | 11 | 12 |
| 2018 | 16 | 20 |
| 2019 | 17 | 23 |
| 2020 | 21 | 20 |
| 2021 | 23 | 23 |
| 2022 | 16 | 25 |
| 2023 | 22 | 14 |
| 2024 | 12 | 16 |
| 2025 | 5 | 10 |
| 2026 | 6 | 10 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Method for obtaining characteristics of surface to be measured, by using inclined tip, atomic force microscope for performing method, and computer program stored in storage medium in order to perform method28 Jul 2026US 12,693,309 B2Park Systems Corp.
- Tip-enhanced spectroscopy7 Jul 2026US 12,674,746 B2Postech Research and Business Development Foundation
- Detection device for scanning probe microscope9 Jun 2026US 12,650,443 B2Vmicro
- Scanning probe microscope9 Jun 2026US 12,650,585 B2Hitachi, Ltd.
- Method and apparatus for measuring magnetic field strength26 May 2026US 12,638,522 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Method for obtaining characteristics of surface to be measured, by using inclined tip, atomic force microscope for performing method, and computer program stored in storage medium in order to perform method8 Oct 2026US 2026/0309746 A1Park Systems Corp.
- Nano-Probe Thermoreflectance Microscopy17 Sep 2026US 2026/0276672 A1Laser Thermal Analysis, Inc.
- Metrology method and associated metrology device6 Aug 2026US 2026/0227426 A1ASML Netherlands B. V.
- A probing device comprising a heat transfer arrangement, a method of manufacturing a probing device, and a method for probing a sample30 Jul 2026US 2026/0219296 A1Teknologian tutkimuskeskus VTT Oy
- Mechanically mediated quantum systems9 Jul 2026US 2026/0195629 A1President and Fellows of Harvard College
Most cited
By later US patents
- Force sensing probe for scanning probe microscopy602US 6,121,611 AArizona Board of Regents · 2000
- Carbon nanotube devices268US 6,528,020 B1The Board of Trustees of the Leland Stanford Junior University · 2003
- Nanometer-scale microscopy probes212US 6,159,742 APresident and Fellows of Harvard College · 2000
- Carbon nanotube structures made using catalyst islands206US 6,346,189 B1The Board of Trustees of the Leland Stanford Junior University · 2002
- Microcasting of microminiature tips139US 4,916,002 AThe Board of Trustees of the Leland Jr. University · 1990