G01Q 70/10
Shape or taper
G01Q70/10 (Shape or taper) appears on 360 US grants and 382 published applications in this corpus.
Search patents in G01Q- Granted patents
- 360
- Published applications
- 382
- Assignees
- 209
- Inventors
- 807
- Latest grant
- 28 Jul 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1991 | 3 | 0 |
| 1992 | 3 | 0 |
| 1993 | 9 | 0 |
| 1994 | 4 | 0 |
| 1995 | 5 | 0 |
| 1996 | 2 | 0 |
| 1997 | 3 | 0 |
| 1998 | 5 | 0 |
| 1999 | 4 | 0 |
| 2000 | 5 | 0 |
| 2001 | 4 | 3 |
| 2002 | 10 | 22 |
| 2003 | 10 | 26 |
| 2004 | 20 | 24 |
| 2005 | 15 | 23 |
| 2006 | 20 | 25 |
| 2007 | 15 | 32 |
| 2008 | 23 | 18 |
| 2009 | 28 | 18 |
| 2010 | 9 | 28 |
| 2011 | 13 | 10 |
| 2012 | 12 | 15 |
| 2013 | 21 | 9 |
| 2014 | 17 | 9 |
| 2015 | 6 | 4 |
| 2016 | 5 | 5 |
| 2017 | 3 | 4 |
| 2018 | 6 | 11 |
| 2019 | 11 | 16 |
| 2020 | 16 | 15 |
| 2021 | 13 | 12 |
| 2022 | 11 | 20 |
| 2023 | 13 | 11 |
| 2024 | 9 | 8 |
| 2025 | 5 | 7 |
| 2026 | 2 | 7 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Method for obtaining characteristics of surface to be measured, by using inclined tip, atomic force microscope for performing method, and computer program stored in storage medium in order to perform method28 Jul 2026US 12,693,309 B2Park Systems Corp.
- Controlled creation of sub-50 nm defects in 2D materials at low temperature19 May 2026US 12,631,666 B2University of Central Florida Research Foundation, Inc.
- Method of manufacturing a MEMS device23 Sep 2025US 12,421,106 B2Cytosurge AG
- Method for measuring, by measurement device, characteristics of surface of object to be measured, atomic force microscope for performing same method, and computer program stored in storage medium to perform same method26 Aug 2025US 12,399,195 B2Park Systems Corp.
- Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor device12 Aug 2025US 12,385,946 B2Korea Advanced Institute of Science and Technology
- Method for obtaining characteristics of surface to be measured, by using inclined tip, atomic force microscope for performing method, and computer program stored in storage medium in order to perform method8 Oct 2026US 2026/0309746 A1Park Systems Corp.
- Nano-Probe Thermoreflectance Microscopy17 Sep 2026US 2026/0276672 A1Laser Thermal Analysis, Inc.
- Metrology method and associated metrology device6 Aug 2026US 2026/0227426 A1ASML Netherlands B. V.
- A probing device comprising a heat transfer arrangement, a method of manufacturing a probing device, and a method for probing a sample30 Jul 2026US 2026/0219296 A1Teknologian tutkimuskeskus VTT Oy
- Micromechanical beam25 Jun 2026US 2026/0176128 A1Nano Analytik GmbH
Most cited
By later US patents
- Carbon nanotube devices268US 6,528,020 B1The Board of Trustees of the Leland Stanford Junior University · 2003
- Nanometer-scale microscopy probes212US 6,159,742 APresident and Fellows of Harvard College · 2000
- Carbon nanotube structures made using catalyst islands206US 6,346,189 B1The Board of Trustees of the Leland Stanford Junior University · 2002
- Carbon nanotube device, manufacturing method of carbon nanotube device, and electron emitting device135US 6,628,053 B1Canon Kabushiki Kaisha · 2003
- Method for manufacturing carbon nanotubes as functional elements of MEMS devices123US 6,146,227 AXidex Corporation · 2000