Micromechanical beam
AssigneesNano Analytik GmbH, neXensor Inc.
InventorIvo RANGELOW
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AssigneesNano Analytik GmbH, neXensor Inc.
InventorIvo RANGELOW
Estimating the term…
A micromechanical beam for scanning probe measurements, lithography and the like, the micromechanical beam extending in a longitudinal direction between a fixed end and a free end. The beam has a height along a height direction perpendicular to the longitudinal direction, the height being smaller than a width along a width direction. Furthermore, the beam has a bending section that is located in the longitudinal direction at the fixed end of the beam and a reinforcement section that is located in the longitudinal direction between the bending section and the free end. In the reinforcement section, the beam has a base element and a reinforcement structure located on the base element, wherein the reinforcement structure is configured to increase a flexural stiffness of the beam in the reinforcement section for bending in the height direction.
1-30. (canceled)
Micromechanical beam for scanning probe measurements, lithography and the like, the micromechanical beam extending in a longitudinal direction between a fixed end and a free end,
Method for fabricating a micromechanical beam,
Dependencies are inferred from the claim text.