G01Q 70/00
General aspects of spm probes, their manufacture or their related instrumentation, insofar
Official title: General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
G01Q70/00 (General aspects of spm probes, their manufacture or their related instrumentation, insofar) appears on 966 US grants and 854 published applications in this corpus.
Search patents in G01Q- Granted patents
- 966
- Published applications
- 854
- Assignees
- 445
- Inventors
- 1,871
- Latest grant
- 1 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1987 | 1 | 0 |
| 1988 | 0 | 0 |
| 1989 | 2 | 0 |
| 1990 | 5 | 0 |
| 1991 | 17 | 0 |
| 1992 | 13 | 0 |
| 1993 | 23 | 0 |
| 1994 | 19 | 0 |
| 1995 | 18 | 0 |
| 1996 | 15 | 0 |
| 1997 | 15 | 0 |
| 1998 | 22 | 0 |
| 1999 | 22 | 0 |
| 2000 | 27 | 0 |
| 2001 | 23 | 7 |
| 2002 | 22 | 40 |
| 2003 | 33 | 41 |
| 2004 | 32 | 47 |
| 2005 | 36 | 52 |
| 2006 | 45 | 53 |
| 2007 | 38 | 74 |
| 2008 | 41 | 46 |
| 2009 | 53 | 37 |
| 2010 | 24 | 45 |
| 2011 | 29 | 25 |
| 2012 | 29 | 29 |
| 2013 | 36 | 20 |
| 2014 | 43 | 34 |
| 2015 | 22 | 20 |
| 2016 | 25 | 26 |
| 2017 | 18 | 20 |
| 2018 | 27 | 34 |
| 2019 | 28 | 32 |
| 2020 | 35 | 33 |
| 2021 | 38 | 36 |
| 2022 | 24 | 31 |
| 2023 | 30 | 20 |
| 2024 | 15 | 25 |
| 2025 | 11 | 12 |
| 2026 | 10 | 15 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Grid plate encoder based positioning system and method1 Sep 2026US 12,724,038 B2Nearfield Instruments B.V.
- Method for obtaining characteristics of surface to be measured, by using inclined tip, atomic force microscope for performing method, and computer program stored in storage medium in order to perform method28 Jul 2026US 12,693,309 B2Park Systems Corp.
- Tip-enhanced spectroscopy7 Jul 2026US 12,674,746 B2Postech Research and Business Development Foundation
- Detection device for scanning probe microscope9 Jun 2026US 12,650,443 B2Vmicro
- Scanning probe microscope9 Jun 2026US 12,650,585 B2Hitachi, Ltd.
- Method for obtaining characteristics of surface to be measured, by using inclined tip, atomic force microscope for performing method, and computer program stored in storage medium in order to perform method8 Oct 2026US 2026/0309746 A1Park Systems Corp.
- Multi-probe atomic force microscopy rotator24 Sep 2026US 2026/0287611 A1Laser Thermal Analysis, Inc.
- Multi-head afm for defect inspection and review24 Sep 2026US 2026/0287612 A1Nearfield Instruments B.V.
- Nano-Probe Thermoreflectance Microscopy17 Sep 2026US 2026/0276672 A1Laser Thermal Analysis, Inc.
- Metrology method and associated metrology device6 Aug 2026US 2026/0227426 A1ASML Netherlands B. V.
Most cited
By later US patents
- Force sensing probe for scanning probe microscopy602US 6,121,611 AArizona Board of Regents · 2000
- Carbon nanotube devices268US 6,528,020 B1The Board of Trustees of the Leland Stanford Junior University · 2003
- Nanometer-scale microscopy probes212US 6,159,742 APresident and Fellows of Harvard College · 2000
- Carbon nanotube structures made using catalyst islands206US 6,346,189 B1The Board of Trustees of the Leland Stanford Junior University · 2002
- Scanning probe microscope143US 5,376,790 APark Scientific Instruments · 1994