G01Q 70/02
Probe holders
G01Q70/02 (Probe holders) appears on 258 US grants and 178 published applications in this corpus.
Search patents in G01Q- Granted patents
- 258
- Published applications
- 178
- Assignees
- 138
- Inventors
- 483
- Latest grant
- 1 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1987 | 1 | 0 |
| 1988 | 0 | 0 |
| 1989 | 2 | 0 |
| 1990 | 3 | 0 |
| 1991 | 7 | 0 |
| 1992 | 9 | 0 |
| 1993 | 8 | 0 |
| 1994 | 5 | 0 |
| 1995 | 5 | 0 |
| 1996 | 7 | 0 |
| 1997 | 4 | 0 |
| 1998 | 9 | 0 |
| 1999 | 7 | 0 |
| 2000 | 8 | 0 |
| 2001 | 14 | 2 |
| 2002 | 8 | 8 |
| 2003 | 5 | 5 |
| 2004 | 5 | 12 |
| 2005 | 12 | 10 |
| 2006 | 8 | 11 |
| 2007 | 9 | 19 |
| 2008 | 9 | 10 |
| 2009 | 11 | 6 |
| 2010 | 6 | 6 |
| 2011 | 6 | 7 |
| 2012 | 7 | 6 |
| 2013 | 7 | 5 |
| 2014 | 13 | 10 |
| 2015 | 9 | 5 |
| 2016 | 1 | 5 |
| 2017 | 3 | 6 |
| 2018 | 6 | 9 |
| 2019 | 9 | 8 |
| 2020 | 12 | 11 |
| 2021 | 7 | 5 |
| 2022 | 3 | 4 |
| 2023 | 7 | 4 |
| 2024 | 1 | 3 |
| 2025 | 1 | 0 |
| 2026 | 4 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Grid plate encoder based positioning system and method1 Sep 2026US 12,724,038 B2Nearfield Instruments B.V.
- Method for obtaining characteristics of surface to be measured, by using inclined tip, atomic force microscope for performing method, and computer program stored in storage medium in order to perform method28 Jul 2026US 12,693,309 B2Park Systems Corp.
- Detection device for scanning probe microscope9 Jun 2026US 12,650,443 B2Vmicro
- Cassette for holding a probe5 May 2026US 12,618,868 B2Nearfield Instruments B.V.
- Active noise isolation for tunneling applications (ANITA)7 Jan 2025US 12,188,960 B2The Penn State Research Foundation
- Method for obtaining characteristics of surface to be measured, by using inclined tip, atomic force microscope for performing method, and computer program stored in storage medium in order to perform method8 Oct 2026US 2026/0309746 A1Park Systems Corp.
- Active dither balancing of a motion stage for scanning probe microscopy28 Nov 2024US 2024/0393363 A1Nearfield Instruments B.V.
- Positioning system and method5 Sep 2024US 2024/0295583 A1Nearfield Instruments B.V.
- Cassette for holding a probe25 Jan 2024US 2024/0027491 A1Nearfield Instruments B.V.
- A probe cassette for storing, transporting and handling one or more probe devices for a probe based system6 Jul 2023US 2023/0213552 A1Nearfield Instruments B.V.
Most cited
By later US patents
- Scanning probe microscope143US 5,376,790 APark Scientific Instruments · 1994
- Object inspection and/or modification system and method89US 6,337,479 B12002
- Atomic force microscope with optional replaceable fluid cell88US 4,935,634 AThe Regents of the University of California · 1990
- Scanning probe microscope having a single viewing device for on-axis and oblique angle views87US 5,714,756 APark Scientific Instruments · 1998
- Scanning probe microscope having automatic probe exchange and alignment86US 5,705,814 ADigital Instruments, Inc. · 1998