Scanning probe microscope having automatic probe exchange and alignment

A method of mounting a probe on a probe mount of a scanning probe microscope which is capable of producing a map of a property of a sample, said microscope including a relative translation system which produces relative translation between the probe mount and the sample, and a probe response detection system for detecting a response of the probe related to the property of the sample, comprising:

• storing on a probe storage device a probe for mounting on said probe mount;
• detecting alignment of the stored probe in relation to the probe response detection system and producing a detection signal corresponding to the detected alignment;
• controlling the relative translation system in response to said detection signal to align the stored probe relative to the probe response detection system based on the alignment detected in said detecting step in order to provide automated probe exchange;
• and
• attaching the stored probe to the probe mount when the detection step detects the probe is in a predetermined position.

An scanning probe microscope which produces a map of at least one property of a sample in relation to detection of a probe response at plural locations on a surface of the sample, comprising:

• a probe storage unit having a stored probe;
• a probe mount on which a probe stored in the probe storage unit is to be mounted;
• a probe response detection system;
• a relative translation system by which relative translation is produced between the probe storage unit and the probe mount and by which relative translation is produced between the probe mount having a probe mounted thereon and the sample;
• a probe alignment detection system;
• a probe pickup device;
• a controller which controls the relative translation system in response to an alignment detection signal produced by said probe alignment detection system to position the probe storage unit in relation to the probe mount based on an output of the probe alignment detection system and which activates the probe pickup device to transfer the stored probe to the probe mount when the probe alignment detection system detects a predetermined probe alignment in order to provide automated probe exchange.