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US 12,188,960 B2Granted
Active noise isolation for tunneling applications (ANITA)
AssigneeThe Penn State Research Foundation
InventorsEric Hudson, Lavish Pabbi
Life of this patent
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Abstract
An active noise isolation apparatus and method for cancelling vibration noise from the probe signal of a scanning tunneling microscope by generating a correction signal by convolution based on the probe signal and the sensor signal, which is based on the ambient vibration that adds noise to the probe signal.
Claims20
A scanning probe microscope, comprising:
- an existing scanning probe microscope (SPM) including:
- a sample holder for holding a sample with a surface;
- a probe operable to provide a probe signal based on the surface of the sample disposed on the sample holder;
- a sensor external to the existing SPM generating a sensor signal based on an ambient vibration, the sensor and probe signals being dimensionally-distinct physical quantities, the ambient vibration creating a relative motion between the probe and the sample surface, the relative motion due to the ambient vibration adding noise to the probe signal;
- and
- a processing unit generating a correction signal by convolution involving dimensioned parameters to account for the sensor and probe being the dimensionally-distinct physical quantities and determining a relationship between the sensor signal and a displacement of the probe based on the probe signal and the sensor signal, the processing unit removing noise from the probe signal by applying the correction signal to the probe signal.
3 more elements
A method of active noise isolation for a scanning probe microscope, comprising the steps:
- providing a scanning probe microscope;
- providing the probe signal from the probe based on the surface of the sample disposed on the sample holder;
- providing an external sensor external to the existing SPM generating a sensor signal based on an ambient vibration, the sensor and probe signals being dimensionally-distinct physical quantities;
- generating the sensor signal from the sensor based on the ambient vibration, the ambient vibration creating the relative motion between the probe and the sample surface, and the relative motion due to the ambient vibration adding noise to the probe signal;
- generating the correction signal from the processing unit by convolution involving dimensioned parameters to account for the sensor and probe being the dimensionally-distinct physical quantities and determining a relationship between the sensor signal and a displacement of the probe based on the probe signal and the sensor signal;
- and
- removing the noise of the ambient vibration from the probe signal using the processing unit by applying the correction signal to the probe signal.
4 more elements
Dependencies are inferred from the claim text.