G01Q 70/04
With compensation for temperature or vibration induced errors
Official title: with compensation for temperature or vibration induced errors
G01Q70/04 (With compensation for temperature or vibration induced errors) appears on 89 US grants and 63 published applications in this corpus.
Search patents in G01Q- Granted patents
- 89
- Published applications
- 63
- Assignees
- 60
- Inventors
- 191
- Latest grant
- 7 Jan 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1989 | 2 | 0 |
| 1990 | 2 | 0 |
| 1991 | 2 | 0 |
| 1992 | 4 | 0 |
| 1993 | 3 | 0 |
| 1994 | 2 | 0 |
| 1995 | 2 | 0 |
| 1996 | 2 | 0 |
| 1997 | 1 | 0 |
| 1998 | 2 | 0 |
| 1999 | 1 | 0 |
| 2000 | 2 | 0 |
| 2001 | 8 | 0 |
| 2002 | 0 | 2 |
| 2003 | 2 | 3 |
| 2004 | 2 | 6 |
| 2005 | 4 | 4 |
| 2006 | 1 | 5 |
| 2007 | 4 | 12 |
| 2008 | 3 | 3 |
| 2009 | 9 | 3 |
| 2010 | 4 | 4 |
| 2011 | 6 | 4 |
| 2012 | 3 | 2 |
| 2013 | 3 | 1 |
| 2014 | 3 | 0 |
| 2015 | 2 | 1 |
| 2016 | 0 | 2 |
| 2017 | 0 | 2 |
| 2018 | 3 | 1 |
| 2019 | 2 | 1 |
| 2020 | 0 | 2 |
| 2021 | 1 | 2 |
| 2022 | 1 | 2 |
| 2023 | 2 | 0 |
| 2024 | 0 | 1 |
| 2025 | 1 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Active noise isolation for tunneling applications (ANITA)7 Jan 2025US 12,188,960 B2The Penn State Research Foundation
- Compensating control signal for raster scan of a scanning probe microscope23 May 2023US 11,656,244 B2Bruker Nano, Inc.
- Scanning probe microscope, scan head and method28 Feb 2023US 11,592,460 B2Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Scanning probe microscope with use of composite materials11 Oct 2022US 11,467,182 B1
- Measuring device for a scanning probe microscope and method for scanning probe microscopy of a measurement sample by means of a scanning probe microscope26 Oct 2021US 11,156,632 B2Bruker Nano, Inc.
- Active dither balancing of a motion stage for scanning probe microscopy28 Nov 2024US 2024/0393363 A1Nearfield Instruments B.V.
- Arrangement Having a Measuring Apparatus for a Scanning Probe Microscope, Scanning Probe Microscope, and Method for Operating4 Aug 2022US 2022/0244287 A1Bruker Nano, Inc.
- Scanning probe microscope, scan head and method24 Feb 2022US 2022/0057430 A1Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Measuring Device for a Scanning Probe Microscope and Method for Scanning Probe Microscopic Examination of a Measurement Sample with a Scanning Probe Microscope24 Jun 2021US 2021/0190818 A1Bruker Nano, Inc.
- Active noise isolation for tunneling applications (anita)28 Jan 2021US 2021/0025919 A1The Penn State Research Foundation
Most cited
By later US patents
- Atomic force microscope with optional replaceable fluid cell88US 4,935,634 AThe Regents of the University of California · 1990
- Scanning tunnel-current-detecting device and method for detecting tunnel current and scanning tunnelling microscope and recording/reproducing device using thereof53US 5,220,555 ACanon Kabushiki Kaisha · 1993
- System and method for deconvoluting the effect of topography on scanning probe microscopy measurements53US 7,366,704 B2Waters Investments Limited · 2008
- System for wide frequency dynamic nanomechanical analysis51US 7,055,378 B2Veeco Instruments Inc. · 2006
- Scanning tunnel-current-detecting device and method for detecting tunnel current and scanning tunnelling microscope and recording/reproducing device using thereof47US 5,107,112 ACanon Kabushiki Kaisha · 1992