Nanometer-scale microscopy probes
AssigneePresident and Fellows of Harvard College
InventorsCharles M. Lieber, Stanislaus S. Wong, Adam T. Woolley, Ernesto Joselevich
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Abstract
A carbon-based tip for scanning probe microscopy. The tip used in microscopy to reveal chemical characteristics of a sample includes a structure of the formula: X--(L--M).sub.n in which n is 1 to 100, X is a carbon-based nanotube, L is a linking group bonded at an end of the carbon-based nanotube, and M is a molecular probe bonded to the linking group.
Claims24
A carbon-based tip for scanning probe microscopy, the tip, used to reveal chemical characteristics of a sample, comprising a structure of the formula:
- X--(L--M).sub.n
- in which n is 1 to 100, X is a carbon-based nanotube having a first end and a second end, L is a linking group bonded at the first end of the carbon-based nanotube, and M is a molecular probe bonded to the linking group, the second end of the carbon-based nanotube being adapted for attachment to a cantilever configured for microscopy.
A method of probing a sample by scanning probe microscopy, the method comprising:
- providing a carbon-based nanotube having a molecular probe linked to one end of the carbon-based nanotube;
- and
- sensing the surface of the sample with the molecular probe to reveal the chemical characteristics of the sample.
A method of removing a molecular probe from a carbon-based tip for use in scanning probe microscopy, the method comprising:
- providing a carbon-based tip which includes a carbon-based nanotube and a molecular probe linked to one end of the carbon-based nanotube;
- providing a metal surface near the first molecular probe;
- and
- applying a voltage between the carbon-based nanotube and the metal surface to remove the molecular probe.
Dependencies are inferred from the claim text.