G01N 23/2252
Measuring emitted x-rays
Official title: Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA]
G01N23/2252 (Measuring emitted x-rays) appears on 258 US grants and 282 published applications in this corpus.
Search patents in G01N- Granted patents
- 258
- Published applications
- 282
- Assignees
- 133
- Inventors
- 561
- Latest grant
- 21 Jul 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 3 | 0 |
| 1989 | 2 | 0 |
| 1990 | 1 | 0 |
| 1991 | 2 | 0 |
| 1992 | 1 | 0 |
| 1993 | 1 | 0 |
| 1994 | 3 | 0 |
| 1995 | 0 | 0 |
| 1996 | 3 | 0 |
| 1997 | 2 | 0 |
| 1998 | 3 | 0 |
| 1999 | 3 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 2 |
| 2003 | 4 | 4 |
| 2004 | 3 | 4 |
| 2005 | 2 | 3 |
| 2006 | 7 | 8 |
| 2007 | 10 | 7 |
| 2008 | 5 | 5 |
| 2009 | 7 | 5 |
| 2010 | 1 | 6 |
| 2011 | 4 | 6 |
| 2012 | 5 | 5 |
| 2013 | 6 | 4 |
| 2014 | 5 | 17 |
| 2015 | 11 | 14 |
| 2016 | 10 | 13 |
| 2017 | 20 | 18 |
| 2018 | 14 | 9 |
| 2019 | 9 | 18 |
| 2020 | 16 | 26 |
| 2021 | 16 | 17 |
| 2022 | 20 | 21 |
| 2023 | 18 | 17 |
| 2024 | 12 | 23 |
| 2025 | 15 | 19 |
| 2026 | 11 | 11 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Live chemical imaging with multiple detectors21 Jul 2026US 12,687,509 B2Oxford Instruments Nanotechnology Tools Limited
- Analysis apparatus, system, method, and program21 Jul 2026US 12,687,510 B2Rigaku Corporation
- Analyzing method and analyzer19 May 2026US 12,631,578 B2JEOL Ltd.
- Spectrum analysis apparatus and database creation method19 May 2026US 12,631,581 B2JEOL Ltd.
- X-ray spectrum analysis apparatus and method12 May 2026US 12,625,097 B2JOEL Ltd.
- Crystal evaluation method17 Sep 2026US 2026/0282842 A1Kioxia Corporation
- Analyzer and Analysis Method27 Aug 2026US 2026/0251596 A1JEOL Ltd.
- Method and Apparatus for Analysis27 Aug 2026US 2026/0251597 A1JEOL Ltd.
- Analysis device20 Aug 2026US 2026/0243663 A1Keyence Corporation
- Al connection material16 Jul 2026US 2026/0200018 A1Nippon Micrometal Corporation
Most cited
By later US patents
- Surface analysis method and apparatus for carrying out the same72US 5,481,109 AHitachi, Ltd. · 1996
- Visual color mapping X-ray analysis apparatus54US 5,357,110 ALink Analytical Limited · 1994
- Method of accurately measuring compositions of thin film shape memory alloys54US 6,620,634 B2TiNi Alloy Company · 2003
- Wavelength-dispersive X-ray spectrometer45US 7,864,922 B2JEOL Ltd. · 2011
- Method and apparatus for material analysis43US 4,476,386 ACommonwealth Scientific and Industrial Research Organization · 1984