G01N 23/00
Investigating or analysing materials by the use of wave or particle radiation
Official title: Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
G01N23/00 (Investigating or analysing materials by the use of wave or particle radiation) appears on 10,996 US grants and 11,319 published applications in this corpus.
Search patents in G01N- Granted patents
- 10,996
- Published applications
- 11,319
- Assignees
- 3,336
- Inventors
- 20,289
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 66 | 0 |
| 1977 | 53 | 0 |
| 1978 | 42 | 0 |
| 1979 | 35 | 0 |
| 1980 | 34 | 0 |
| 1981 | 45 | 0 |
| 1982 | 38 | 0 |
| 1983 | 43 | 0 |
| 1984 | 47 | 0 |
| 1985 | 43 | 0 |
| 1986 | 59 | 0 |
| 1987 | 74 | 0 |
| 1988 | 64 | 0 |
| 1989 | 86 | 0 |
| 1990 | 73 | 0 |
| 1991 | 91 | 0 |
| 1992 | 71 | 0 |
| 1993 | 58 | 0 |
| 1994 | 60 | 0 |
| 1995 | 82 | 0 |
| 1996 | 94 | 0 |
| 1997 | 81 | 0 |
| 1998 | 115 | 0 |
| 1999 | 97 | 0 |
| 2000 | 116 | 0 |
| 2001 | 166 | 57 |
| 2002 | 208 | 197 |
| 2003 | 221 | 244 |
| 2004 | 217 | 302 |
| 2005 | 201 | 334 |
| 2006 | 280 | 363 |
| 2007 | 275 | 328 |
| 2008 | 285 | 346 |
| 2009 | 279 | 295 |
| 2010 | 273 | 247 |
| 2011 | 220 | 291 |
| 2012 | 212 | 291 |
| 2013 | 253 | 450 |
| 2014 | 310 | 553 |
| 2015 | 432 | 584 |
| 2016 | 445 | 452 |
| 2017 | 485 | 560 |
| 2018 | 445 | 551 |
| 2019 | 506 | 596 |
| 2020 | 627 | 629 |
| 2021 | 567 | 623 |
| 2022 | 508 | 641 |
| 2023 | 494 | 657 |
| 2024 | 496 | 657 |
| 2025 | 547 | 588 |
| 2026 | 377 | 483 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
- G01N 23/02Investigating or analysing materials by the use of wave or particle radiation5,717
- G01N 23/22Investigating or analysing materials by the use of wave or particle radiation3,436
- G01N 23/20Investigating or analysing materials by the use of wave or particle radiation2,617
- G01N 23/005Investigating or analysing materials by the use of wave or particle radiation55
Recent patents
- Construction material assessment method and systems6 Oct 2026US 12,754,146 B2
- X-ray inspection apparatus6 Oct 2026US 12,754,147 B2Ishida Co., Ltd.
- Systems and methods for using multi-dimensional X-ray imaging in meat production and processing applications6 Oct 2026US 12,754,148 B2Rapiscan Holdings, Inc.
- Attitude adjustment structure, conveying device, radiation imaging system6 Oct 2026US 12,754,149 B2Nuctech Company Limited
- Overlay target measurement and shift compensation in charged particle systems and related methods6 Oct 2026US 12,754,150 B2Applied Materials Israel Ltd.
- Battery cell inspection apparatus, battery cell inspection method, and battery cell inspection system8 Oct 2026US 2026/0309647 A1SK On Co., Ltd.
- X-ray inspection apparatus8 Oct 2026US 2026/0309648 A1Anritsu Corporation
- Resection margin assessment8 Oct 2026US 2026/0309649 A1Jettec AB
- Image processing apparatus, image processing method, and image processing program8 Oct 2026US 2026/0309650 A1FUJIFILM Corporation
- Method for scanning an object in a scanning apparatus8 Oct 2026US 2026/0309651 A1ROLLS-ROYCE plc
Most cited
By later US patents
- Computed tomography metrology496US 5,848,115 AGeneral Electric Company · 1998
- Systems and methods for imaging large field-of-view objects486US 7,108,421 B2Breakaway Imaging, LLC · 2006
- Thiol labeling of DNA for attachment to gold surfaces400US 5,472,881 AUniversity of Utah Research Foundation · 1995
- Apparatus and method for automatic recognition of concealed objects using multiple energy computed tomography368US 6,018,562 AThe United States of America as represented by the Secretary of the Army · 2000
- Method for reconstructing a three-dimensional image volume and x-ray devices347US 7,711,083 B2Siemens Aktiengesellschaft · 2010