G01N 23/20
Investigating or analysing materials by the use of wave or particle radiation
Official title: by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
G01N23/20 (Investigating or analysing materials by the use of wave or particle radiation) appears on 2,617 US grants and 2,725 published applications in this corpus.
Search patents in G01N- Granted patents
- 2,617
- Published applications
- 2,725
- Assignees
- 1,078
- Inventors
- 5,455
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 13 | 0 |
| 1977 | 9 | 0 |
| 1978 | 16 | 0 |
| 1979 | 6 | 0 |
| 1980 | 8 | 0 |
| 1981 | 9 | 0 |
| 1982 | 7 | 0 |
| 1983 | 8 | 0 |
| 1984 | 11 | 0 |
| 1985 | 8 | 0 |
| 1986 | 10 | 0 |
| 1987 | 20 | 0 |
| 1988 | 10 | 0 |
| 1989 | 20 | 0 |
| 1990 | 18 | 0 |
| 1991 | 23 | 0 |
| 1992 | 19 | 0 |
| 1993 | 14 | 0 |
| 1994 | 15 | 0 |
| 1995 | 22 | 0 |
| 1996 | 15 | 0 |
| 1997 | 17 | 0 |
| 1998 | 28 | 0 |
| 1999 | 18 | 0 |
| 2000 | 20 | 0 |
| 2001 | 26 | 13 |
| 2002 | 45 | 44 |
| 2003 | 40 | 50 |
| 2004 | 53 | 73 |
| 2005 | 44 | 63 |
| 2006 | 61 | 73 |
| 2007 | 45 | 55 |
| 2008 | 39 | 74 |
| 2009 | 60 | 65 |
| 2010 | 67 | 49 |
| 2011 | 39 | 64 |
| 2012 | 39 | 75 |
| 2013 | 57 | 100 |
| 2014 | 66 | 107 |
| 2015 | 119 | 166 |
| 2016 | 96 | 129 |
| 2017 | 120 | 150 |
| 2018 | 136 | 172 |
| 2019 | 150 | 189 |
| 2020 | 174 | 161 |
| 2021 | 159 | 148 |
| 2022 | 121 | 171 |
| 2023 | 131 | 175 |
| 2024 | 140 | 147 |
| 2025 | 137 | 121 |
| 2026 | 89 | 91 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
- G01N 23/207Diffractometry using detectors743
- G01N 23/20008Constructional details of analysers611
- G01N 23/203Measuring back scattering543
- G01N 23/201By measuring small-angle scattering244
- G01N 23/2055Analysing diffraction patterns164
- G01N 23/20075By measuring interferences of x-rays149
- G01N 23/20083By using a combination of at least two measurements at least one109
- G01N 23/20091Measuring the energy-dispersion spectrum [eds] of diffracted radiation99
Recent patents
- Overlay target measurement and shift compensation in charged particle systems and related methods6 Oct 2026US 12,754,150 B2Applied Materials Israel Ltd.
- System and method for approximating X-ray intensities for a sample measured by an X-ray detection system6 Oct 2026US 12,754,151 B2Bruker AXS GmbH
- Image analyzer for material structure using Fourier transform and principal component analysis6 Oct 2026US 12,755,511 B2Toyota Jidosha Kabushiki Kaisha
- Patterned X-ray emitting target29 Sep 2026US 12,749,642 B2Nova Measuring Instruments Ltd.
- Methods and systems for model-less, scatterometry based measurements of semiconductor structures22 Sep 2026US 12,743,027 B2KLA Corporation
- Systems And Method for Interpreting High Energy Interactions8 Oct 2026US 2026/0309654 A1Decision Tree, LLC
- Device for Contactless Measurement of the Microstructure of Moving Material Webs1 Oct 2026US 2026/0298848 A1IMS Messsysteme GmbH
- Evaluation method for all-solid-state lithium-ion batteries1 Oct 2026US 2026/0298849 A1JX Advanced Metals Corporation
- Device and method for testing surface hydration inhibition of drilling fluid24 Sep 2026US 2026/0287526 A1Southwest Petroleum University
- Hybrid x-ray and optical metrology and navigation24 Sep 2026US 2026/0287527 A1Tokyo Electron Limited
Most cited
By later US patents
- Detection of concealed explosives and contraband345US 5,600,303 ATechnology International Incorporated · 1997
- Identifying explosives or other contraband by employing transmitted or scattered X-rays341US 5,974,111 AVivid Technologies, Inc. · 1999
- Detecting explosives or other contraband by employing transmitted and scattered X-rays291US 5,600,700 AVivid Technologies, Inc. · 1997
- Mobile X-ray inspection system for large objects276US 5,764,683 AAmerican Science and Engineering, Inc. · 1998
- X-ray backscatter imaging system including moving body tracking assembly275US 6,094,472 ARapiscan Security Products, Inc. · 2000