G01N 23/201
By measuring small-angle scattering
Official title: by measuring small-angle scattering
G01N23/201 (By measuring small-angle scattering) appears on 244 US grants and 271 published applications in this corpus.
Search patents in G01N- Granted patents
- 244
- Published applications
- 271
- Assignees
- 140
- Inventors
- 521
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1980 | 1 | 0 |
| 1981 | 0 | 0 |
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 2 | 0 |
| 1989 | 0 | 0 |
| 1990 | 2 | 0 |
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 3 | 0 |
| 1994 | 0 | 0 |
| 1995 | 1 | 0 |
| 1996 | 1 | 0 |
| 1997 | 1 | 0 |
| 1998 | 1 | 0 |
| 1999 | 2 | 0 |
| 2000 | 1 | 0 |
| 2001 | 2 | 0 |
| 2002 | 2 | 1 |
| 2003 | 3 | 2 |
| 2004 | 3 | 8 |
| 2005 | 2 | 4 |
| 2006 | 9 | 6 |
| 2007 | 3 | 5 |
| 2008 | 2 | 8 |
| 2009 | 6 | 5 |
| 2010 | 5 | 2 |
| 2011 | 2 | 4 |
| 2012 | 2 | 2 |
| 2013 | 1 | 9 |
| 2014 | 3 | 12 |
| 2015 | 9 | 20 |
| 2016 | 9 | 5 |
| 2017 | 12 | 14 |
| 2018 | 8 | 16 |
| 2019 | 16 | 27 |
| 2020 | 19 | 20 |
| 2021 | 28 | 18 |
| 2022 | 13 | 15 |
| 2023 | 21 | 22 |
| 2024 | 12 | 19 |
| 2025 | 18 | 16 |
| 2026 | 16 | 11 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Image analyzer for material structure using Fourier transform and principal component analysis6 Oct 2026US 12,755,511 B2Toyota Jidosha Kabushiki Kaisha
- Methods and systems for model-less, scatterometry based measurements of semiconductor structures22 Sep 2026US 12,743,027 B2KLA Corporation
- Determining tilt angle of substrate structures utilizing angular fourier decomposition of scattering images25 Aug 2026US 12,716,854 B2APPLIED Materials.Inc.
- X-ray scattering apparatus and x-ray scattering method25 Aug 2026US 12,716,855 B2Xenocs SAS
- Control apparatus, system, method and program11 Aug 2026US 12,704,468 B2Rigaku Corporation
- Hybrid x-ray and optical metrology and navigation24 Sep 2026US 2026/0287527 A1Tokyo Electron Limited
- Method and program for calculating small-angle x-ray scattering intensity distribution6 Aug 2026US 2026/0227349 A1Samsung Electronics Co., Ltd.
- Method for nondestructive characterization of pore structure of rock sample, device, medium, and product16 Jul 2026US 2026/0202303 A1Northeast Petroleum University
- Control apparatus, kratzky block, control method and control program11 Jun 2026US 2026/0160715 A1Rigaku Corporation
- Fatty acid composition4 Jun 2026US 2026/0152694 A1Neste Oyj
Most cited
By later US patents
- Coherent x-ray scatter inspection system with sidescatter and energy-resolved detection215US 6,442,233 B1American Science and Engineering, Inc. · 2002
- Method and arrangement for identifying crystalline and polycrystalline materials161US 5,787,145 AHeimann Systems GmbH · 1998
- X-ray diffraction inspection system92US 5,007,072 AIon Track Instruments, Inc. · 1991
- X-ray inspection by coherent-scattering from variably disposed scatterers identified as suspect objects92US 6,621,888 B2American Science and Engineering, Inc. · 2003
- X-ray analysis apparatus with a graded multilayer mirror86US 6,226,349 B1Bruker AXS Analytical X-Ray Systems GmbH · 2001