G01N 23/20083
By using a combination of at least two measurements at least one
Official title: {by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement}
G01N23/20083 (By using a combination of at least two measurements at least one) appears on 109 US grants and 118 published applications in this corpus.
Search patents in G01N- Granted patents
- 109
- Published applications
- 118
- Assignees
- 70
- Inventors
- 214
- Latest grant
- 15 Jul 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1980 | 1 | 0 |
| 1981 | 0 | 0 |
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 1 | 0 |
| 1989 | 2 | 0 |
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 1 | 0 |
| 1993 | 1 | 0 |
| 1994 | 0 | 0 |
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 1 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 1 | 1 |
| 2008 | 0 | 8 |
| 2009 | 4 | 15 |
| 2010 | 8 | 6 |
| 2011 | 9 | 8 |
| 2012 | 3 | 4 |
| 2013 | 4 | 4 |
| 2014 | 4 | 3 |
| 2015 | 9 | 6 |
| 2016 | 4 | 10 |
| 2017 | 6 | 7 |
| 2018 | 5 | 5 |
| 2019 | 7 | 6 |
| 2020 | 5 | 7 |
| 2021 | 7 | 6 |
| 2022 | 4 | 5 |
| 2023 | 4 | 6 |
| 2024 | 7 | 5 |
| 2025 | 6 | 4 |
| 2026 | 0 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Methods and systems for regularizing the optimization of application specific semiconductor measurement system parameter settings15 Jul 2025US 12,360,062 B1KLA Corporation
- Backscatter imaging system15 Jul 2025US 12,360,065 B2Varex Imaging Corporation
- Backscatter X-ray system20 May 2025US 12,306,118 B2Shenzhen Xpectvision Technology Co., Ltd.
- X-ray analysis system and method with multi-source design6 May 2025US 12,292,396 B2Shenzhen Angstrom Excellence Technology Co. Ltd
- Parameterizing x-ray scattering measurement using slice-and-image tomographic imaging of semiconductor structures29 Apr 2025US 12,288,706 B2Carl Zeiss SMT GmbH
- Diffraction detection apparatus, inspection device, inspection method and inspection system23 Jul 2026US 2026/0210881 A1
- Segmenting method for delimiting objects as segments in a package in an x-ray diffraction analysis4 Jun 2026US 2026/0154930 A1Smiths Detection Germany GmbH
- Method and System for Detecting a Material14 Aug 2025US 2025/0258116 A1Viken Detection Corporation
- Device for measuring elemental and molecular properties with hybrid electromagnetic waves31 Jul 2025US 2025/0244234 A1Haus Sps Makina Elektronik Bilisim Sanayi Ve Ticaret Anonim Sirketi
- In-situ analysis of drilling fluid solids during wellbore drilling31 Jul 2025US 2025/0244262 A1Saudi Arabian Oil Company
Most cited
By later US patents
- Interrupted-fan-beam imaging128US 6,269,142 B12001
- Tomographic method of x-ray imaging118US 5,696,806 A1997
- X-ray inspection with contemporaneous and proximal transmission and backscatter imaging100US 7,555,099 B2American Science and Engineering, Inc. · 2009
- X-ray tomography inspection systems98US 7,876,879 B2Rapiscan Systems, Inc. · 2011
- X-ray monitoring system87US 5,428,657 AGeorgia Tech Research Corporation · 1995