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US 12,306,118 B2Granted
Backscatter X-ray system
AssigneeShenzhen Xpectvision Technology Co., Ltd.
InventorsPeiyan Cao, Yurun Liu
Life of this patent
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Abstract
Disclosed herein is a backscatter X-ray system comprising: an X-ray source configured to scan a sheet of X-ray across an object, wherein the sheet of X-ray illuminates one line on a surface of the object; a sensor configured to differentiate backscattered X-ray from different spots along the line.
Claims17
A system comprising:
- an X-ray source configured to scan a sheet of X-ray across an object, wherein the sheet of X-ray illuminates one line on a surface of the object;
- a sensor configured to differentiate backscattered X-ray from different spots along the line;
- wherein the sensor collects backscattered X-ray from different spots along the line using different portions of the sensor;
- wherein the different portions are different lines on the sensor.
1 more element
Dependencies are inferred from the claim text.