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US 5,428,657 AGranted
X-ray monitoring system
AssigneeGeorgia Tech Research Corporation
InventorsChris D. Papanicolopoulos, J. Craig Wyvill, Wayne D. R. Daley, William R. Owens
Life of this patent
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AssigneeGeorgia Tech Research Corporation
InventorsChris D. Papanicolopoulos, J. Craig Wyvill, Wayne D. R. Daley, William R. Owens
Estimating the term…
The invention is a method and apparatus for identifying and pinpointing the location of unwanted pieces of material or defects in, for example, de-boned poultry pieces. The poultry pieces to be inspected are carried on a conveyor and passed under an impinging collimated X-ray beam. The Rayleigh scattering resulting is detected and measured, as is the Compton back scattering and the data is processed in a processing unit to determine the location and type of foreign matter involved. The ratio of the Rayleigh and Compton scattering is also determined and used to verify the identity of the foreign material. Transmitted X-rays, i.e., radioscopy, are used to normalize the data, and to aid in a pinpointing of the location of the unwanted material.
A method of locating and identifying unwanted matter or defects in a piece of material comprising the steps of:
The method as claimed in claim 5 wherein the energy of the X-ray beam source is approximately 90 keV and the angle .theta. is approximately 2.8 degrees whereby bone is the unwanted matter detected.
A method of locating and identifying unwanted matter in poultry pieces comprising:
An apparatus for inspecting one or more material pieces for the presence therein of pieces of unwanted matter comprising:
Dependencies are inferred from the claim text.