G01N 23/207
Diffractometry using detectors
Official title: Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
G01N23/207 (Diffractometry using detectors) appears on 743 US grants and 721 published applications in this corpus.
Search patents in G01N- Granted patents
- 743
- Published applications
- 721
- Assignees
- 375
- Inventors
- 1,521
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 3 | 0 |
| 1977 | 3 | 0 |
| 1978 | 7 | 0 |
| 1979 | 2 | 0 |
| 1980 | 2 | 0 |
| 1981 | 5 | 0 |
| 1982 | 1 | 0 |
| 1983 | 3 | 0 |
| 1984 | 6 | 0 |
| 1985 | 4 | 0 |
| 1986 | 4 | 0 |
| 1987 | 9 | 0 |
| 1988 | 3 | 0 |
| 1989 | 7 | 0 |
| 1990 | 9 | 0 |
| 1991 | 7 | 0 |
| 1992 | 6 | 0 |
| 1993 | 4 | 0 |
| 1994 | 4 | 0 |
| 1995 | 8 | 0 |
| 1996 | 2 | 0 |
| 1997 | 9 | 0 |
| 1998 | 10 | 0 |
| 1999 | 3 | 0 |
| 2000 | 4 | 0 |
| 2001 | 6 | 0 |
| 2002 | 9 | 4 |
| 2003 | 2 | 10 |
| 2004 | 10 | 17 |
| 2005 | 9 | 13 |
| 2006 | 11 | 17 |
| 2007 | 12 | 17 |
| 2008 | 6 | 22 |
| 2009 | 18 | 18 |
| 2010 | 19 | 9 |
| 2011 | 8 | 21 |
| 2012 | 15 | 20 |
| 2013 | 17 | 31 |
| 2014 | 17 | 35 |
| 2015 | 29 | 53 |
| 2016 | 32 | 26 |
| 2017 | 28 | 49 |
| 2018 | 42 | 40 |
| 2019 | 38 | 63 |
| 2020 | 50 | 41 |
| 2021 | 54 | 41 |
| 2022 | 43 | 59 |
| 2023 | 44 | 40 |
| 2024 | 37 | 33 |
| 2025 | 38 | 25 |
| 2026 | 24 | 17 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- System and method for approximating X-ray intensities for a sample measured by an X-ray detection system6 Oct 2026US 12,754,151 B2Bruker AXS GmbH
- Patterned X-ray emitting target29 Sep 2026US 12,749,642 B2Nova Measuring Instruments Ltd.
- Differentiation of clastic sedimentary systems using March-Dollase preferred orientation actor15 Sep 2026US 12,736,486 B2Saudi Arabian Oil Company
- Radio wave absorber and radio wave absorbing composition15 Sep 2026US 12,738,665 B2FUJIFILM Corporation
- Diagnostic systems and methods with global data center and local autonomous cell11 Aug 2026US 12,706,215 B2EosDx Inc.
- Systems And Method for Interpreting High Energy Interactions8 Oct 2026US 2026/0309654 A1Decision Tree, LLC
- Semiconductor metrology system and method10 Sep 2026US 2026/0268232 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Systems and methods for nanocrystal fabrication20 Aug 2026US 2026/0242974 A1
- X-ray diffraction apparatus and method for analysing packaged samples20 Aug 2026US 2026/0243711 A1Malvern Panalytical Limited
- Processing method and system for three-dimensional neutron diffraction data of single crystal material23 Jul 2026US 2026/0210883 A1Shanghai Jiao Tong University
Most cited
By later US patents
- Detection of concealed explosives and contraband345US 5,600,303 ATechnology International Incorporated · 1997
- Detecting explosives or other contraband by employing transmitted and scattered X-rays291US 5,600,700 AVivid Technologies, Inc. · 1997
- Detection of concealed explosives and contraband234US 5,692,029 ATechnology International Incorporated · 1997
- Sidescatter X-ray detection system228US 5,642,394 AAmerican Science and Engineering, Inc. · 1997
- Method and arrangement for identifying crystalline and polycrystalline materials161US 5,787,145 AHeimann Systems GmbH · 1998