US 2026/0243711 A1 · X-RAY DIFFRACTION APPARATUS AND METHOD FOR ANALYSING PACKAGED SAMPLES

Abstract

The present invention relates to a method and an X-ray diffraction apparatus for angular dispersive X-ray diffraction analysis of a packaged sample. The method comprises arranging a first primary X-ray optic between an X-ray source and the packaged sample to focus X-rays from the X-ray source into a focused X-ray beam of convergent or parallel X-rays and to direct the focused X-ray beam towards the packaged sample and arranging a first secondary X-ray optic between the packaged sample and an X-ray detector. The packaged sample is irradiated, by the X-ray source, with the focused X-ray beam of converging or parallel beam of X-rays, The first secondary X-ray optic is configured such that a first portion of diffracted X-rays pass therethrough to be detected by the X-ray detector and a second portion of diffracted X-rays are prevented from being detected by the X-ray detector.

Claims15

Dependent claims

A method of angular dispersive X-ray diffraction analysis for analysing a packaged sample, wherein the packaged sample comprises an analyte confined in a packaging, the method comprising:

arranging a first primary X-ray optic between an X-ray source and the packaged sample to focus X-rays from the X-ray source into a focused X-ray beam of convergent or parallel X-rays and to direct the focused X-ray beam towards the packaged sample;
arranging a first secondary X-ray optic between the packaged sample and an X-ray detector;
using the X-ray source to irradiate the packaged sample with the focused X-ray beam of converging or parallel X-rays, the X-rays having an energy greater than about 9 keV, while the analyte is confined in the packaging;
and
configuring the first secondary X-ray optic such that a first portion of diffracted X-rays pass therethrough to be detected by the X-ray detector and a second portion of diffracted X-rays are prevented from being detected by the X-ray detector, wherein the first portion of diffracted X-rays come from a region substantially within the packaging.

2 more elements

An X-ray diffraction apparatus for angular dispersive X-ray diffraction analysis of a packaged sample, the X-ray diffraction apparatus comprising:

a sample support for supporting the packaged sample, the packaged sample comprising an analyte confined in a packaging;
an X-ray source for irradiating the packaged sample with incident X-rays, wherein the incident X-rays are directed towards the packaged sample along an incident beam path;
a first primary X-ray optic arranged in the incident beam path, wherein the first primary X-ray optic is arranged to focus the incident X-rays into a convergent or parallel X-ray beam, and to direct the X-ray beam towards the packaged sample;
an X-ray detector arranged to receive diffracted X-rays from the packaged sample;
and
a first secondary X-ray optic arranged between the sample support and the X-ray detector to allow a first portion of diffracted X-rays to reach the X-ray detector and to prevent a second portion of diffracted X-rays from being detected by the X-ray detector, wherein the first secondary X-ray optic is configured such that the first portion of diffracted X-rays come from a region substantially within the packaging.

3 more elements

Dependencies are inferred from the claim text.

X-ray diffraction apparatus and method for analysing packaged samples

Life of this patent

X-ray diffraction apparatus and method for analysing packaged samples

Life of this patent

Abstract

Claims15