G01N 23/2076
For spectrometry, i.e. using an analysing crystal
Official title: {for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS}
G01N23/2076 (For spectrometry, i.e. using an analysing crystal) appears on 139 US grants and 131 published applications in this corpus.
Search patents in G01N- Granted patents
- 139
- Published applications
- 131
- Assignees
- 97
- Inventors
- 363
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 1 | 0 |
| 1979 | 1 | 0 |
| 1980 | 1 | 0 |
| 1981 | 1 | 0 |
| 1982 | 0 | 0 |
| 1983 | 1 | 0 |
| 1984 | 2 | 0 |
| 1985 | 1 | 0 |
| 1986 | 2 | 0 |
| 1987 | 1 | 0 |
| 1988 | 0 | 0 |
| 1989 | 3 | 0 |
| 1990 | 4 | 0 |
| 1991 | 2 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 2 | 0 |
| 1998 | 2 | 0 |
| 1999 | 1 | 0 |
| 2000 | 1 | 0 |
| 2001 | 0 | 0 |
| 2002 | 1 | 0 |
| 2003 | 0 | 1 |
| 2004 | 1 | 0 |
| 2005 | 0 | 3 |
| 2006 | 2 | 2 |
| 2007 | 2 | 1 |
| 2008 | 0 | 1 |
| 2009 | 1 | 2 |
| 2010 | 1 | 1 |
| 2011 | 0 | 4 |
| 2012 | 1 | 0 |
| 2013 | 1 | 4 |
| 2014 | 3 | 7 |
| 2015 | 4 | 7 |
| 2016 | 6 | 3 |
| 2017 | 3 | 10 |
| 2018 | 7 | 11 |
| 2019 | 8 | 13 |
| 2020 | 8 | 15 |
| 2021 | 18 | 12 |
| 2022 | 11 | 10 |
| 2023 | 11 | 5 |
| 2024 | 6 | 5 |
| 2025 | 10 | 10 |
| 2026 | 5 | 4 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- System and method for approximating X-ray intensities for a sample measured by an X-ray detection system6 Oct 2026US 12,754,151 B2Bruker AXS GmbH
- Holder, analysis apparatus including the same, and battery analysis method21 Jul 2026US 12,687,507 B2Shimadzu Corporation
- Semiconductor metrology system and method2 Jun 2026US 12,645,992 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Measurement and determination of crystallographic texture with respect to position12 May 2026US 12,625,096 B2ROLLS-ROYCE plc
- X-ray analyzer with movable slit between sample and analyzing crystal13 Jan 2026US 12,523,622 B2Shimadzu Corporation
- Systems And Method for Interpreting High Energy Interactions8 Oct 2026US 2026/0309654 A1Decision Tree, LLC
- Semiconductor metrology system and method10 Sep 2026US 2026/0268232 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Apparatus and method for detecting reflective electron16 Apr 2026US 2026/0104369 A1Samsung Eletronics Co., Ltd.
- Neutron or mixed field dosimeter2 Apr 2026US 2026/0093050 A1
- Blade tip wear detection system and methods for aerospace components13 Nov 2025US 2025/0347593 A1Rtx Corporation
Most cited
By later US patents
- Angle dispersive x-ray spectrometer103US 5,923,720 AMolecular Metrology, Inc. · 1999
- Analysis methods for energy dispersive X-ray diffraction patterns101US 6,118,850 ARutgers, The State University · 2000
- X-ray surface analysis and measurement apparatus66US 9,594,036 B2Sigray, Inc. · 2017
- High brightness X-ray absorption spectroscopy system56US 9,448,190 B2Sigray, Inc. · 2016
- Apparatus for simultaneous X-ray diffraction and X-ray fluorescence measurements48US 5,745,543 AU. S. Philips Corporation · 1998