Measurement and determination of crystallographic texture with respect to position

A device comprising:

• a measurement device configured to measure a crystalline structure of a material and output an alpha phase data set indicative of the measurement of the crystalline structure;
• a memory;
• and
• one or more processors implemented in circuitry and in communication with the memory, the one or more processors configured to:
• receive the alpha phase data set, wherein the alpha phase data set comprises a plurality of pixels, wherein each pixel of the plurality of pixels includes a position, a first Euler angle (φ1), a second Euler angle Φ, and a third Euler angle (φ2), wherein the third Euler angle (φ2) is missing or erroneous;
• adjust the third Euler angle (φ2) of a pixel of the plurality of pixels;
• and
• store, based on adjusting the third Euler angle (φ2) of the pixel reducing a total beta phase misorientation, the alpha phase data set.

A non-transitory computer-readable storage medium having stored thereon instructions that, when executed, configure a processor to:

• receive an alpha phase data set, wherein the alpha phase data set comprises a plurality of pixels, wherein each pixel of the plurality of pixels includes a position, a first Euler angle (φ1), a second Euler angle Φ, and a third Euler angle (φ2), wherein the third Euler angle (φ2) is missing or erroneous;
• adjust the third Euler angle (φ2) of a pixel of the plurality of pixels;
• and
• store, based on adjusting the third Euler angle (φ2) of the pixel reducing a total beta phase misorientation, the alpha phase data set.