Angle dispersive x-ray spectrometer
AssigneeMolecular Metrology, Inc.
InventorsScott W. Barton, Peter M. Calandra
Life of this patent
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AssigneeMolecular Metrology, Inc.
InventorsScott W. Barton, Peter M. Calandra
Estimating the term…
An x-ray spectrometer is provided comprising an X-ray source, a curved crystal monochromator which focuses a monochromatic x-ray beam onto a sample surface, the curved crystal monochromator comprising a shape which is substantially identical to a logarithmic spiral, and a position-sensitive x-ray detector. A method of measuring diffraction intensities from oriented samples in real time including providing an x-ray spectrometer comprising an X-ray source, a curved crystal monochromator which focuses a monochromatic x-ray beam onto a sample surface, the curved monochromator comprising the shape of a logarithmic spiral, and a position-sensitive x-ray detector; and providing a crystallographically oriented sample, exposing the sample to the focused x-ray beam of the x-ray spectrometer; and measuring the diffraction intensity at the position-sensitive detector.
An x-ray spectrometer, comprising:
A curved crystal monochromator which focuses a monochromatic x-ray beam onto a sample surface, wherein the width of the curved crystal monochromator is linearly tapered along an arclength s of the crystal.
A method for measuring electron density in a lipid layer, comprising:
A method of measuring diffraction intensities from oriented samples in real time, comprising;
Dependencies are inferred from the claim text.