Apparatus for simultaneous X-ray diffraction and X-ray fluorescence measurements

An apparatus for the examination of materials by simultaneous X-ray diffraction and X-ray fluorescence, comprising:

• a sample location (4) for accommodating a sample (2) of the material to be examined,
• an X-ray source (10) for irradiating the sample holder (4) by means of polychromatic X-rays (6, 18),
• a collimator (14) which is arranged to transmit at least one X-ray beam of line-shaped cross-section and is positioned between the X-ray source (10) and the sample holder (4),
• a diffraction unit (24) which comprises a detection device (26) for the detection of X-rays (28) diffracted by the sample (2) of the material to be examined, and
• a fluorescence unit (40) which comprises a detection device with an analysis crystal (42) for the detection of fluorescent radiation (46) generated in the sample (2) of the material to be examined,
• characterized in that
• the X-ray source (10) is arranged to produce a line-shaped X-ray focus (20),
• the collimator (14) comprises only one aperture (16) which extends parallel to the line-shaped X-ray focus (20), and
• the detection device of the fluorescence unit (40) comprises a location-sensitive detection array (44) for the detection of X-rays (48) reflected by the analysis crystal (42).