G01N 23/203
Measuring back scattering
G01N23/203 (Measuring back scattering) appears on 543 US grants and 549 published applications in this corpus.
Search patents in G01N- Granted patents
- 543
- Published applications
- 549
- Assignees
- 266
- Inventors
- 1,082
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 3 | 0 |
| 1977 | 2 | 0 |
| 1978 | 4 | 0 |
| 1979 | 2 | 0 |
| 1980 | 1 | 0 |
| 1981 | 2 | 0 |
| 1982 | 2 | 0 |
| 1983 | 2 | 0 |
| 1984 | 3 | 0 |
| 1985 | 4 | 0 |
| 1986 | 4 | 0 |
| 1987 | 4 | 0 |
| 1988 | 2 | 0 |
| 1989 | 6 | 0 |
| 1990 | 4 | 0 |
| 1991 | 7 | 0 |
| 1992 | 3 | 0 |
| 1993 | 3 | 0 |
| 1994 | 4 | 0 |
| 1995 | 3 | 0 |
| 1996 | 4 | 0 |
| 1997 | 3 | 0 |
| 1998 | 3 | 0 |
| 1999 | 1 | 0 |
| 2000 | 1 | 0 |
| 2001 | 5 | 3 |
| 2002 | 3 | 2 |
| 2003 | 3 | 3 |
| 2004 | 4 | 6 |
| 2005 | 4 | 5 |
| 2006 | 6 | 13 |
| 2007 | 6 | 11 |
| 2008 | 6 | 13 |
| 2009 | 16 | 10 |
| 2010 | 11 | 11 |
| 2011 | 11 | 13 |
| 2012 | 6 | 17 |
| 2013 | 16 | 21 |
| 2014 | 21 | 26 |
| 2015 | 42 | 36 |
| 2016 | 22 | 27 |
| 2017 | 27 | 34 |
| 2018 | 24 | 22 |
| 2019 | 24 | 37 |
| 2020 | 30 | 40 |
| 2021 | 39 | 42 |
| 2022 | 31 | 33 |
| 2023 | 28 | 37 |
| 2024 | 27 | 36 |
| 2025 | 30 | 26 |
| 2026 | 24 | 25 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Overlay target measurement and shift compensation in charged particle systems and related methods6 Oct 2026US 12,754,150 B2Applied Materials Israel Ltd.
- Enclosed x-ray chopper wheel8 Sep 2026US 12,730,081 B2Videray Technologies, Inc.
- Bonding wire for semiconductor devices8 Sep 2026US 12,733,530 B2Nippon Micrometal Corporation
- Target X-ray inspection system and method1 Sep 2026US 12,723,994 B2Viken Detection Corporation
- Bonding wire for semiconductor devices25 Aug 2026US 12,721,208 B2Nippon Micrometal Corporation
- Backscatter Scanning Systems with Different Detector Panel Configurations17 Sep 2026US 2026/0276858 A1American Science and Engineering, Inc.
- Automated scanning electron microscopy analysis of mineral wool fiber diameter10 Sep 2026US 2026/0266600 A1United States Gypsum Company
- Measurement System, Computer, and Measurement Method10 Sep 2026US 2026/0268470 A1Hitachi High-Tech Corporation
- Apparatus and Method for Sensing and Analyzing Skin Condition6 Aug 2026US 2026/0228888 A1Lumenis Be Ltd.
- Inspection device, inspection method and inspection system30 Jul 2026US 2026/0219212 A1
Most cited
By later US patents
- Detection of concealed explosives and contraband345US 5,600,303 ATechnology International Incorporated · 1997
- Detecting explosives or other contraband by employing transmitted and scattered X-rays291US 5,600,700 AVivid Technologies, Inc. · 1997
- X-ray backscatter imaging system including moving body tracking assembly275US 6,094,472 ARapiscan Security Products, Inc. · 2000
- Automatic threat detection based on illumination by penetrating radiant energy using histogram processing266US 5,022,062 AAmerican Science and Engineering, Inc. · 1991
- Detection of concealed explosives and contraband234US 5,692,029 ATechnology International Incorporated · 1997