G01N 2021/8854
Grading and classifying of flaws
Official title: {Grading and classifying of flaws}
G01N2021/8854 (Grading and classifying of flaws) appears on 720 US grants and 933 published applications in this corpus.
Search patents in G01N- Granted patents
- 720
- Published applications
- 933
- Assignees
- 485
- Inventors
- 2,329
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1984 | 1 | 0 |
| 1985 | 2 | 0 |
| 1986 | 1 | 0 |
| 1987 | 2 | 0 |
| 1988 | 3 | 0 |
| 1989 | 4 | 0 |
| 1990 | 3 | 0 |
| 1991 | 7 | 0 |
| 1992 | 1 | 0 |
| 1993 | 7 | 0 |
| 1994 | 4 | 0 |
| 1995 | 4 | 0 |
| 1996 | 1 | 0 |
| 1997 | 3 | 0 |
| 1998 | 0 | 0 |
| 1999 | 2 | 0 |
| 2000 | 1 | 0 |
| 2001 | 2 | 4 |
| 2002 | 4 | 12 |
| 2003 | 6 | 5 |
| 2004 | 3 | 12 |
| 2005 | 9 | 10 |
| 2006 | 14 | 20 |
| 2007 | 13 | 24 |
| 2008 | 13 | 20 |
| 2009 | 19 | 26 |
| 2010 | 19 | 24 |
| 2011 | 20 | 14 |
| 2012 | 16 | 25 |
| 2013 | 20 | 26 |
| 2014 | 19 | 13 |
| 2015 | 16 | 20 |
| 2016 | 19 | 26 |
| 2017 | 26 | 36 |
| 2018 | 27 | 43 |
| 2019 | 35 | 57 |
| 2020 | 59 | 55 |
| 2021 | 38 | 66 |
| 2022 | 39 | 82 |
| 2023 | 55 | 60 |
| 2024 | 61 | 92 |
| 2025 | 72 | 93 |
| 2026 | 50 | 68 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
- G01N 2021/8861Determining coordinates of flawsIndexing code304
- G01N 2021/8867Using sequentially two or more inspection runsIndexing code187
- G01N 2021/8874Taking dimensions of defect into accountIndexing code82
- G01N 2021/888Marking defectsIndexing code78
- G01N 2021/8877Proximity analysis, local statisticsIndexing code44
- G01N 2021/8858Flaw countingIndexing code19
Recent patents
- Deterioration estimation system, deterioration estimation method, and recording medium6 Oct 2026US 12,754,141 B2NEC Corporation
- Lock-in averaging for semiconductor diagnostics6 Oct 2026US 12,754,145 B2Imec Vzw
- Classification of defect patterns of substrates22 Sep 2026US 12,743,765 B2APPLIED Materials.Inc.
- Optical foreign substance detection device using light scattering and image analysis15 Sep 2026US 12,736,472 B2Jedex Inc.
- Overlay measurement apparatus and overlay measurement method8 Sep 2026US 12,730,079 B2Auros Technology, Inc.
- Inspection apparatus, inspection method using the inspection apparatus, and electronic device inspected by the inspection apparatus1 Oct 2026US 2026/0298836 A1Samsung Display Co., Ltd.
- Method and device for determining a level of contamination of a surface1 Oct 2026US 2026/0298837 A1Airbus Operations GmbH
- Wind turbine blade manufacturing using intelligent imaging17 Sep 2026US 2026/0278762 A1Vestas Wind Systems A/S
- Computer system, sample observation method, and program17 Sep 2026US 2026/0278771 A1Hitachi High-Tech Corporation
- Inspection apparatus and determination model generation method10 Sep 2026US 2026/0266737 A1Astemo, Ltd.
Most cited
By later US patents
- Two-phase optical inspection method and apparatus for defect detection177US 5,699,447 AOrbot Instruments Ltd. · 1997
- Electronic control of an automatic wafer inspection system169US 4,644,172 AKLA Instruments Corporation · 1987
- Method and apparatus for inspection of specular, three-dimensional features125US 5,058,178 AAT&T Bell Laboratories · 1991
- Inspection system and method for bond detection and validation of surface mount devices108US 5,963,662 AGeorgia Tech Research Corporation · 1999
- Particle detection method including comparison between sequential scans100US 4,766,324 ATencor Instruments · 1988