G01N 2021/8877
Proximity analysis, local statistics
Official title: {Proximity analysis, local statistics}
G01N2021/8877 (Proximity analysis, local statistics) appears on 44 US grants and 57 published applications in this corpus.
Search patents in G01N- Granted patents
- 44
- Published applications
- 57
- Assignees
- 41
- Inventors
- 138
- Latest grant
- 6 Jan 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 1 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 1 |
| 2005 | 0 | 0 |
| 2006 | 0 | 7 |
| 2007 | 2 | 3 |
| 2008 | 1 | 1 |
| 2009 | 4 | 0 |
| 2010 | 2 | 4 |
| 2011 | 1 | 0 |
| 2012 | 2 | 2 |
| 2013 | 3 | 3 |
| 2014 | 0 | 1 |
| 2015 | 2 | 5 |
| 2016 | 3 | 1 |
| 2017 | 2 | 4 |
| 2018 | 5 | 3 |
| 2019 | 2 | 1 |
| 2020 | 1 | 2 |
| 2021 | 1 | 2 |
| 2022 | 2 | 4 |
| 2023 | 2 | 2 |
| 2024 | 2 | 3 |
| 2025 | 4 | 2 |
| 2026 | 1 | 6 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Multi-angle vehicle defect measurement using surface-adaptive optical corrections6 Jan 2026US 12,517,061 B2UVeye Ltd.
- System and method for electromagnetic monitoring of active cracks in concrete dam23 Sep 2025US 12,422,373 B2Tsinghua University
- Image inspection apparatus and image inspection method13 May 2025US 12,299,870 B2Keyence Corporation
- Deterioration diagnosis device, deterioration diagnosis method, and recording medium6 May 2025US 12,292,388 B2NEC Corporation
- Surface defect monitoring system18 Mar 2025US 12,253,471 B2Terracon Consultants, Inc.
- Defect inspection device, processing device, and defect inspection method30 Jul 2026US 2026/0219201 A1Hitachi High-Tech Corporation
- Monitoring tool and method of use23 Jul 2026US 2026/0210871 A1GLOBALFOUNDRIES U. S. Inc.
- Method and system for detection of bevel edge2 Jul 2026US 2026/0185948 A1Onto Innovation Inc.
- Optical hole inspection apparatus and methods14 May 2026US 2026/0133134 A1The Boeing Company
- Edge detection in an image of a semiconductor specimen16 Apr 2026US 2026/0104365 A1Applied Materials Israel Ltd.
Most cited
By later US patents
- Method of and apparatus for inspecting transparent object for defect44US 5,216,481 AToyo Glass Co., Ltd. · 1993
- System and method for inspecting a workpiece surface using surface structure spatial frequencies26US 7,286,218 B2KLA-Tencor Technologies Corporation · 2007
- Charge coupled device based blemish detection system and method19US 4,454,541 ARCA Corporation · 1984
- System and method for signal processing for a workpiece surface inspection system18US 7,505,125 B2KLA-Tencor Corporation · 2009
- System and method for controlling light scattered from a workpiece surface in a surface inspection system16US 7,417,722 B2KLA-Tencor Technologies Corporation · 2008