G01N 2021/8874
Taking dimensions of defect into account
Official title: {Taking dimensions of defect into account}
G01N2021/8874 (Taking dimensions of defect into account) appears on 82 US grants and 103 published applications in this corpus.
Search patents in G01N- Granted patents
- 82
- Published applications
- 103
- Assignees
- 94
- Inventors
- 333
- Latest grant
- 15 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 2 | 0 |
| 1990 | 2 | 0 |
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 1 |
| 2005 | 0 | 1 |
| 2006 | 1 | 0 |
| 2007 | 2 | 1 |
| 2008 | 1 | 3 |
| 2009 | 3 | 3 |
| 2010 | 1 | 1 |
| 2011 | 1 | 2 |
| 2012 | 1 | 5 |
| 2013 | 4 | 3 |
| 2014 | 3 | 2 |
| 2015 | 2 | 3 |
| 2016 | 2 | 2 |
| 2017 | 2 | 3 |
| 2018 | 4 | 4 |
| 2019 | 3 | 6 |
| 2020 | 8 | 4 |
| 2021 | 4 | 8 |
| 2022 | 1 | 6 |
| 2023 | 12 | 7 |
| 2024 | 2 | 16 |
| 2025 | 9 | 16 |
| 2026 | 9 | 6 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Optical foreign substance detection device using light scattering and image analysis15 Sep 2026US 12,736,472 B2Jedex Inc.
- Inspection apparatus, recording medium, and inspection system25 Aug 2026US 12,716,849 B2Konica Minolta, Inc.
- Method and system for detecting a false error on a component of a board inspected by an AOI machine11 Aug 2026US 12,704,464 B2Siemens Industry Software Inc.
- Method of identifying defects in crystals28 Apr 2026US 12,613,168 B2GlobalWafers Co., Ltd.
- Defect inspection device and method for inspecting defect24 Mar 2026US 12,584,865 B2Samsung Display Co., Ltd.
- Portable imaging system and method thereof20 Aug 2026US 2026/0243672 A1National Taipei University of Technology
- Inspection device20 Aug 2026US 2026/0243700 A1Saki Corporation
- System for Analyzing Foreign Substance in Positive Electrode Material and Method for Analyzing Foreign Substance in Positive Electrode Material30 Jul 2026US 2026/0219200 A1LG Energy Solution, Ltd.
- Defect detection method, defect detection device, and defect detection program23 Jul 2026US 2026/0210873 A1FUJIFILM Corporation
- Metal container inspection device16 Apr 2026US 2026/0102811 A1Ingenet Automatizacion, S.L.
Most cited
By later US patents
- Defect-recognition processing apparatus66US 4,958,373 AKabushiki Kaisha Toshiba · 1990
- System for checking defects on a flat surface of an object32US 4,508,450 AOlympus Optical Co., Ltd. · 1985
- Optical robotic canopy polishing system29US 5,067,085 ASouthwest Research Institute · 1991
- Method and apparatus for estimating life expectancy of mechanical structures28US 4,875,170 AHitachi, Ltd. · 1989
- Test system for optical disks20US 4,832,487 AYokogawa Electric Corporation · 1989