Defect detection method, defect detection device, and defect detection program
AssigneeFUJIFILM Corporation
InventorHaruka IKEDA
Life of this patent
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Abstract
In a defect detection method, a computer acquires a first inference result output by a first detection model in response to input of a target image to the first detection model for detecting a first type defect, acquires a second inference result output by a second detection model in response to input of the same target image to the second detection model for detecting a second type defect, and outputs, based on the first inference result and the second inference result, a detection result indicating a single defect or a series of defects within the target image.
Claims10
A defect detection method in which a computer
- acquires a first inference result output by a first detection model in response to input of a target image to the first detection model for detecting a first type defect,
- acquires a second inference result output by a second detection model in response to input of the same target image to the second detection model for detecting a second type defect, and
- outputs, based on the first inference result and the second inference result, a detection result indicating a single defect or a series of defects within the target image.
A defect detection device comprising a processor configured to:
- acquire a first inference result output by a first detection model in response to input of a target image to the first detection model for detecting a first type defect;
- acquire a second inference result output by a second detection model in response to input of the same target image to the second detection model for detecting a second type defect;
- and
- output, based on the first inference result and the second inference result, a detection result indicating a single defect or a series of defects within the target image.
A non-transitory computer-readable storage medium storing a defect detection program for causing a computer to:
- acquire a first inference result output by a first detection model in response to input of a target image to the first detection model for detecting a first type defect;
- acquire a second inference result output by a second detection model in response to input of the same target image to the second detection model for detecting a second type defect;
- and
- output, based on the first inference result and the second inference result, a detection result indicating a single defect or a series of defects within the target image.
Dependencies are inferred from the claim text.