G01N 2021/8858
Flaw counting
Official title: {Flaw counting}
G01N2021/8858 (Flaw counting) appears on 19 US grants and 27 published applications in this corpus.
Search patents in G01N- Granted patents
- 19
- Published applications
- 27
- Assignees
- 32
- Inventors
- 94
- Latest grant
- 21 Oct 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 1 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 1 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 3 |
| 2010 | 1 | 0 |
| 2011 | 1 | 0 |
| 2012 | 1 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 3 |
| 2017 | 0 | 1 |
| 2018 | 3 | 2 |
| 2019 | 0 | 0 |
| 2020 | 3 | 4 |
| 2021 | 1 | 2 |
| 2022 | 2 | 1 |
| 2023 | 1 | 1 |
| 2024 | 2 | 3 |
| 2025 | 2 | 4 |
| 2026 | 0 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Method of inspecting semiconductor device21 Oct 2025US 12,449,377 B2Samsung Electronics Co., Ltd.
- Nondestructive characterization for crystalline wafers26 Aug 2025US 12,402,380 B2Wolfspeed, Inc.
- Nondestructive characterization for crystalline wafers16 Jul 2024US 12,040,355 B2Wolfspeed, Inc.
- Systems and methods for enhanced evaluation of pre-owned electronic devices and provision of related services9 Jul 2024US 12,033,477 B2A La Carte Media, Inc.
- Method for estimating twin defect density22 Aug 2023US 11,733,177 B2The Industry & Academic Cooperation in Chungnam National University (IAC)
- Defect detection method, defect detection device, and defect detection program23 Jul 2026US 2026/0210873 A1FUJIFILM Corporation
- Metal plate and deposition mask comprising same26 Mar 2026US 2026/0085395 A1LG Innotek Co., Ltd.
- Nondestructive characterization for crystalline wafers13 Nov 2025US 2025/0351495 A1Wolfspeed, Inc.
- Sheet fixing apparatus and method of manufacturing combination of workpiece and sheet fixed thereto23 Oct 2025US 2025/0327757 A1Disco Corporation
- Inspection and measurement system for straight hollow cylindrical objects23 Oct 2025US 2025/0327759 A1Bitmapper Integration Technologies
Most cited
By later US patents
- Method of measuring the period of surface defects18US 4,982,600 AFuji Photo Film Co., Ltd. · 1991
- Method and system for determining cumulative foreign object characteristics during fabrication of a composite structure17US 8,068,659 B2The Boeing Company · 2011
- Inspection and cosmetic grading through image processing system and method14US 10,753,882 B12020
- System and method for detection of mobile device fault conditions12US 11,210,777 B2Blancco Technology Group IP Oy · 2021
- System and method for self-performing a cosmetic evaluation of an electronic device8US 10,007,934 B2Greystone Data Technology, Inc. · 2018