Inspection apparatus and determination model generation method

An inspection apparatus configured to detect a defect in an inspection target using a target image acquired by imaging the inspection target, the inspection apparatus comprising:

• a pseudo defect target image generation portion configured to generate a pseudo defect target image by synthesizing a pseudo defect element image mimicking a defective portion with a normal target image, the pseudo defect target image generation portion being configured to change at least one of a state of the pseudo defect element image, a synthesization position in the normal target image, or a state of the synthesization position in the normal target image according to the synthesization position in the normal target image at which the pseudo defect element image is synthesized, the state of the synthesization position in the normal target image, and the state of the pseudo defect element image, and synthesize the pseudo defect element image at the synthesization position in the normal target image;
• a learning processing portion configured to generate a determination model by causing the pseudo defect target image to be machine-learned;
• and
• a determination processing portion configured to detect the defect from a target image acquired by imaging the inspection target using the determination model.