G01N 2021/888
Marking defects
Official title: {Marking defects}
G01N2021/888 (Marking defects) appears on 78 US grants and 111 published applications in this corpus.
Search patents in G01N- Granted patents
- 78
- Published applications
- 111
- Assignees
- 82
- Inventors
- 294
- Latest grant
- 25 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2002 | 0 | 1 |
| 2003 | 0 | 1 |
| 2004 | 0 | 2 |
| 2005 | 2 | 0 |
| 2006 | 0 | 1 |
| 2007 | 1 | 0 |
| 2008 | 0 | 1 |
| 2009 | 1 | 0 |
| 2010 | 0 | 1 |
| 2011 | 0 | 1 |
| 2012 | 0 | 4 |
| 2013 | 1 | 3 |
| 2014 | 3 | 1 |
| 2015 | 3 | 3 |
| 2016 | 1 | 5 |
| 2017 | 3 | 2 |
| 2018 | 5 | 7 |
| 2019 | 6 | 7 |
| 2020 | 7 | 6 |
| 2021 | 4 | 10 |
| 2022 | 5 | 14 |
| 2023 | 9 | 13 |
| 2024 | 7 | 11 |
| 2025 | 14 | 11 |
| 2026 | 6 | 6 |
By publication year. 2026 runs to 8 Oct.
Recent patents
- Monitoring system, monitoring method, program, and computer-readable recording medium in which computer program is stored25 Aug 2026US 12,718,348 B2Nippon Steel Corporation
- Method for detecting at least one defect on a support, device and computer program associated25 Aug 2026US 12,718,350 B2Aqc Industry
- Marking system and marking method for identifying defect of electrode sheet23 Jun 2026US 12,663,380 B2LG Energy Solution, Ltd.
- Information processing apparatus and information processing method24 Feb 2026US 12,560,508 B2Canon Kabushiki Kaisha
- Information processing apparatus, information processing method, and non-transitory computer-readable storage medium13 Jan 2026US 12,523,616 B2Canon Kabushiki Kaisha
- Method and device for determining a level of contamination of a surface1 Oct 2026US 2026/0298837 A1Airbus Operations GmbH
- Slitting device, secondary battery manufacturing system comprising same, and method for manufacturing secondary battery30 Jul 2026US 2026/0221411 A1LG Energy Solution, Ltd.
- System for monitoring vehicle manufacturing process employing portable vision system and quality monitoring system26 Mar 2026US 2026/0086041 A1Ford Global Technologies, LLC
- Inspection apparatus and inspection system5 Mar 2026US 2026/0063566 A1Canon Kabushiki Kaisha
- Multi-sensor test device for quality control scanning26 Feb 2026US 2026/0056132 A1Micron Technology, Inc.
Most cited
By later US patents
- System for identifying defects in a composite structure66US 6,871,684 B2The Boeing Company · 2005
- System and method for identifying defects in a composite structure41US 7,171,033 B2The Boeing Company · 2007
- Detecting surface flaws using computer vision40US 10,346,969 B1Amazon Technologies, Inc. · 2019
- Detecting surface flaws using computer vision11US 10,839,506 B1Amazon Technologies, Inc. · 2020
- Inspection tool9US 9,672,486 B1PK Companies Group, LLC · 2017