Method for detecting at least one defect on a support, device and computer program associated
AssigneeAqc Industry
InventorsPierre Magrangeas, Christian Bracich, Wilson Veloz Parra, Stéphanie Pottecher, Benoît Berthelier, Omar Chimère Ndiaye, Adrien Binet, Caroline Senac, Nicolas Toussaint, Renard Zélia Ferret, Carlo Dri, Igor Zerjal
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