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US 2026/0063566 A1Published application
Inspection apparatus and inspection system
AssigneeCanon Kabushiki Kaisha
InventorMASAAKI MURAISHI
Life of this patent
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Abstract
An inspection system includes a reading unit configured to acquire a scanned image by reading a recording medium on which an image is formed, and one or more controllers having one or more processors and one or more memories, the one or more controllers being configured to register a reference image, perform an inspection on the scanned image by comparing the scanned image with the reference image, set an inspection area to be inspected in the inspection, and delete a part of the inspection area.
Claims19
An inspection system comprising:
- a reading unit configured to acquire a scanned image by reading a recording medium on which an image is formed;
- and
- one or more controllers having one or more processors and one or more memories, the one or more controllers being configured to:
- register a reference image;
- perform an inspection on the scanned image by comparing the scanned image with the reference image;
- set an inspection area to be inspected in the inspection;
- and
- delete a part of the inspection area.
5 more elements
An inspection apparatus comprising:
- a reading unit configured to acquire a scanned image by reading a recording medium on which an image is formed;
- and
- one or more controllers having one or more processors and one or more memories, the one or more controllers being configured to:
- register a reference image;
- perform an inspection on the scanned image by comparing the scanned image with the reference image;
- set an inspection area to be inspected in the inspection;
- and
- delete a part of the inspection area.
5 more elements
Dependencies are inferred from the claim text.