H10P 52/402
Of semiconductor materials
Official title: {of semiconductor materials}
H10P52/402 (Of semiconductor materials) appears on 1,797 US grants and 2,162 published applications in this corpus.
Search patents in H10P- Granted patents
- 1,797
- Published applications
- 2,162
- Assignees
- 498
- Inventors
- 3,678
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 3 | 0 |
| 1978 | 2 | 0 |
| 1979 | 1 | 0 |
| 1980 | 0 | 0 |
| 1981 | 3 | 0 |
| 1982 | 1 | 0 |
| 1983 | 1 | 0 |
| 1984 | 3 | 0 |
| 1985 | 0 | 0 |
| 1986 | 1 | 0 |
| 1987 | 1 | 0 |
| 1988 | 1 | 0 |
| 1989 | 1 | 0 |
| 1990 | 3 | 0 |
| 1991 | 3 | 0 |
| 1992 | 1 | 0 |
| 1993 | 1 | 0 |
| 1994 | 2 | 0 |
| 1995 | 1 | 0 |
| 1996 | 1 | 0 |
| 1997 | 2 | 0 |
| 1998 | 3 | 0 |
| 1999 | 17 | 0 |
| 2000 | 21 | 0 |
| 2001 | 43 | 13 |
| 2002 | 40 | 34 |
| 2003 | 33 | 36 |
| 2004 | 30 | 49 |
| 2005 | 27 | 32 |
| 2006 | 31 | 33 |
| 2007 | 30 | 31 |
| 2008 | 14 | 23 |
| 2009 | 22 | 24 |
| 2010 | 15 | 30 |
| 2011 | 22 | 27 |
| 2012 | 15 | 26 |
| 2013 | 35 | 67 |
| 2014 | 42 | 97 |
| 2015 | 81 | 177 |
| 2016 | 124 | 145 |
| 2017 | 139 | 158 |
| 2018 | 133 | 154 |
| 2019 | 140 | 162 |
| 2020 | 147 | 177 |
| 2021 | 113 | 136 |
| 2022 | 98 | 129 |
| 2023 | 102 | 103 |
| 2024 | 91 | 120 |
| 2025 | 90 | 100 |
| 2026 | 66 | 79 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Optical thickness control during a chemical mechanical polishing process and apparatus for effecting the same6 Oct 2026US 12,752,390 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Polishing method for gallium nitride wafer6 Oct 2026US 12,757,663 B2Disco Corporation
- Methods of forming an abrasive slurry and methods for chemical-mechanical polishing29 Sep 2026US 12,746,637 B2Taiwan Semiconductor Manufacturing Company.Ltd
- System and method for controlling chemical mechanical planarization29 Sep 2026US 12,751,254 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Polishing composition for semiconductor process and method for polishing a substrate using the same22 Sep 2026US 12,742,096 B2Ycchem Co., Ltd.
- Semiconductor processing tool and methods of operation8 Oct 2026US 2026/0307200 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Finfet device having flat-top epitaxial features and method of making the same8 Oct 2026US 2026/0314059 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Semiconductor device structure and manufacturing method thereof8 Oct 2026US 2026/0314277 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Polishing pad and method for polishing object to be polished1 Oct 2026US 2026/0295771 A1Kureha Corporation
- Cmp polishing liquid and polishing method1 Oct 2026US 2026/0297379 A1Resonac Corporation
Most cited
By later US patents
- Apparatus and method for forming semiconductor contacts1,331US 8,772,109 B2Taiwan Semiconductor Manufacturing Company.Ltd · 2014
- Continuous processing system for chemical mechanical polishing501US 5,738,574 AAPPLIED Materials.Inc. · 1998
- Indirect endpoint detection by chemical reaction and chemiluminescence486US 6,126,848 AInternational Business Machines Corporation · 2000
- Method for thinning a bonding wafer238US 8,476,165 B2Tokyo Electron Limited · 2013
- Method for improving uniformity of chemical-mechanical planarization process238US 8,647,987 B2The Institute of Microelectronics Chinese Academy of Science · 2014