H01J 37/3005
Observing the objects or the point of impact on the object
Official title: {Observing the objects or the point of impact on the object}
H01J37/3005 (Observing the objects or the point of impact on the object) appears on 244 US grants and 239 published applications in this corpus.
Search patents in H01J- Granted patents
- 244
- Published applications
- 239
- Assignees
- 96
- Inventors
- 552
- Latest grant
- 18 Nov 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 2 | 0 |
| 1987 | 2 | 0 |
| 1988 | 3 | 0 |
| 1989 | 3 | 0 |
| 1990 | 2 | 0 |
| 1991 | 3 | 0 |
| 1992 | 3 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 4 | 0 |
| 1996 | 5 | 0 |
| 1997 | 3 | 0 |
| 1998 | 3 | 0 |
| 1999 | 0 | 0 |
| 2000 | 2 | 0 |
| 2001 | 3 | 0 |
| 2002 | 3 | 3 |
| 2003 | 4 | 4 |
| 2004 | 3 | 5 |
| 2005 | 5 | 6 |
| 2006 | 4 | 8 |
| 2007 | 2 | 5 |
| 2008 | 3 | 7 |
| 2009 | 7 | 7 |
| 2010 | 2 | 4 |
| 2011 | 5 | 8 |
| 2012 | 9 | 13 |
| 2013 | 8 | 8 |
| 2014 | 11 | 13 |
| 2015 | 12 | 14 |
| 2016 | 15 | 14 |
| 2017 | 19 | 12 |
| 2018 | 15 | 15 |
| 2019 | 11 | 10 |
| 2020 | 15 | 14 |
| 2021 | 11 | 13 |
| 2022 | 20 | 10 |
| 2023 | 4 | 12 |
| 2024 | 7 | 9 |
| 2025 | 9 | 9 |
| 2026 | 0 | 16 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Specimen machining device and specimen machining method18 Nov 2025US 12,476,071 B2JEOL Ltd.
- Systems, devices, and methods for aligning a particle beam and performing a non-contact electrical measurement on a cell and/or non-contact electrical measurement cell vehicle using a registration cell30 Sep 2025US 12,431,333 B2PDF Solutions, Inc.
- Tweezers, conveyance device, and method for conveying sample piece29 Jul 2025US 12,374,520 B2Hitachi High-Tech Corporation
- System and method for uniform ion milling15 Jul 2025US 12,362,130 B2E. A. Fischione Instruments, Inc.
- Method for positioning objects in a particle beam microscope with the aid of a flexible particle beam barrier13 May 2025US 12,300,459 B2Carl Zeiss Microscopy GmbH
- Focused ion beam system with single optical column17 Sep 2026US 2026/0279716 A1Ales Tech Inc.
- Composite Beam Apparatus13 Aug 2026US 2026/0237598 A1Hitachi High-Tech Corporation
- Charged Particle Beam Device and Method for Producing and Observing Sample Piece6 Aug 2026US 2026/0229446 A1Hitachi High-Tech Corporation
- Charged particle beam device and method for controlling charged particle beam device6 Aug 2026US 2026/0229452 A1Hitachi High-Tech Analysis Corporation
- Processing Method and Charged Particle Beam Device30 Jul 2026US 2026/0221384 A1Hitachi High-Tech Corporation
Most cited
By later US patents
- Electron beam inspection system and method266US 5,578,821 AKLA Instruments Corporation · 1996
- Multilayered device micro etching method and system96US 5,055,696 AHitachi, Ltd. · 1991
- Inspecting optical masks with electron beam microscopy95US 5,717,204 AKLA Instruments Corporation · 1998
- Scanning electron microscope and method for production of semiconductor device by using the same90US 5,412,210 AHitachi, Ltd. · 1995
- Pattern inspection apparatus and electron beam apparatus86US 5,430,292 AFujitsu Limited · 1995