H01J 37/24
Circuit arrangements not adapted to a particular application of the tube and
Official title: Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for
H01J37/24 (Circuit arrangements not adapted to a particular application of the tube and) appears on 378 US grants and 390 published applications in this corpus.
Search patents in H01J- Granted patents
- 378
- Published applications
- 390
- Assignees
- 181
- Inventors
- 919
- Latest grant
- 15 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 5 | 0 |
| 1977 | 6 | 0 |
| 1978 | 1 | 0 |
| 1979 | 1 | 0 |
| 1980 | 2 | 0 |
| 1981 | 1 | 0 |
| 1982 | 4 | 0 |
| 1983 | 3 | 0 |
| 1984 | 5 | 0 |
| 1985 | 2 | 0 |
| 1986 | 3 | 0 |
| 1987 | 4 | 0 |
| 1988 | 3 | 0 |
| 1989 | 0 | 0 |
| 1990 | 2 | 0 |
| 1991 | 1 | 0 |
| 1992 | 3 | 0 |
| 1993 | 4 | 0 |
| 1994 | 1 | 0 |
| 1995 | 1 | 0 |
| 1996 | 1 | 0 |
| 1997 | 2 | 0 |
| 1998 | 3 | 0 |
| 1999 | 3 | 0 |
| 2000 | 0 | 0 |
| 2001 | 4 | 0 |
| 2002 | 1 | 0 |
| 2003 | 2 | 4 |
| 2004 | 2 | 5 |
| 2005 | 1 | 6 |
| 2006 | 9 | 13 |
| 2007 | 10 | 11 |
| 2008 | 10 | 6 |
| 2009 | 4 | 6 |
| 2010 | 7 | 5 |
| 2011 | 5 | 6 |
| 2012 | 3 | 14 |
| 2013 | 11 | 8 |
| 2014 | 10 | 11 |
| 2015 | 15 | 31 |
| 2016 | 15 | 11 |
| 2017 | 11 | 22 |
| 2018 | 27 | 28 |
| 2019 | 29 | 23 |
| 2020 | 23 | 33 |
| 2021 | 24 | 27 |
| 2022 | 28 | 25 |
| 2023 | 27 | 22 |
| 2024 | 15 | 25 |
| 2025 | 8 | 27 |
| 2026 | 16 | 21 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Control system and method for ion energy distribution in plasma process chambers using tailored waveform generators15 Sep 2026US 12,738,450 B2Inspiring Atoms Pte Ltd
- Method for operating a particle beam microscope15 Sep 2026US 12,738,452 B2Carl Zeiss Microscopy GmbH
- Charged particle beam device25 Aug 2026US 12,719,006 B2Hitachi High-Tech Corporation
- Method for operating a multi-beam particle microscope with fast closed-loop beam current control, computer program product and multi-beam particle microscope25 Aug 2026US 12,719,015 B2Carl Zeiss MultiSEM GmbH
- Method for doping two-dimensional material based on cluster ion implantation25 Aug 2026US 12,719,017 B2Jiangsu Jichuang Atomic Cluster Technology Research Institute Co., Ltd.
- Sample chamber heating assembly1 Oct 2026US 2026/0302127 A1
- Image grabbing mapping method to improve system productivity in a system with multiple electron beams24 Sep 2026US 2026/0290745 A1KLA Corporation
- Electron beam irradiation apparatus and contact point conductivity inspection method24 Sep 2026US 2026/0290746 A1NuFlare Technology, Inc.
- Electron emission apparatus and electronic apparatus10 Sep 2026US 2026/0269164 A1Westlake University
- Ion Milling Device and Processing Method Using Same27 Aug 2026US 2026/0253837 A1Hitachi High-Tech Corporation
Most cited
By later US patents
- Raster scan control system for a charged-particle beam216US 5,017,789 ALoma Linda University Medical Center · 1991
- E-beam high voltage switching power supply156US 5,610,452 AThe United States of America as represented by the United States Department of Energy · 1997
- System, method and apparatus for controlling ion energy distribution128US 9,287,086 B2Advanced Energy Industries, Inc. · 2016
- Wide dynamic range ion energy bias control; fast ion energy switching; ion energy control and a pulsed bias supply; and a virtual front panel98US 9,105,447 B2Advanced Energy Industries, Inc. · 2015
- Method for controlling ion energy distribution97US 9,208,992 B2Advanced Energy Industries, Inc. · 2015