H01J 2237/2802
Transmission microscopes
H01J2237/2802 (Transmission microscopes) appears on 473 US grants and 538 published applications in this corpus.
Search patents in H01J- Granted patents
- 473
- Published applications
- 538
- Assignees
- 171
- Inventors
- 922
- Latest grant
- 15 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1979 | 1 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 1 | 0 |
| 1986 | 1 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 1 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 2 | 0 |
| 1999 | 1 | 0 |
| 2000 | 2 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 2 |
| 2003 | 3 | 5 |
| 2004 | 7 | 6 |
| 2005 | 4 | 4 |
| 2006 | 2 | 7 |
| 2007 | 5 | 9 |
| 2008 | 6 | 8 |
| 2009 | 5 | 16 |
| 2010 | 11 | 12 |
| 2011 | 6 | 17 |
| 2012 | 18 | 24 |
| 2013 | 26 | 19 |
| 2014 | 25 | 18 |
| 2015 | 24 | 29 |
| 2016 | 27 | 36 |
| 2017 | 29 | 35 |
| 2018 | 34 | 29 |
| 2019 | 34 | 40 |
| 2020 | 43 | 30 |
| 2021 | 32 | 24 |
| 2022 | 23 | 42 |
| 2023 | 32 | 40 |
| 2024 | 24 | 31 |
| 2025 | 25 | 35 |
| 2026 | 18 | 20 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Laser thermal epitaxy in a charged particle microscope15 Sep 2026US 12,738,446 B2FEI Company
- Magnetization device for an electron microscope and method8 Sep 2026US 12,731,756 B2Forschungszentrum Julich GmbH
- Method of sample preparation and analysis25 Aug 2026US 12,719,012 B2FEI Company
- Sample holder, electron microscope system and sample observation method18 Aug 2026US 12,712,146 B2Hitachi, Ltd.
- Electron spectrometer calibration method14 Jul 2026US 12,683,115 B2Ecole Polytechnique Federale De Lausanne (Epfl)
- Scanning electron microscopy-based sample analysis1 Oct 2026US 2026/0302129 A1Infineon Technologies AG
- Method for operating a beam device, computer program and beam device for carrying out the method as well as a method for generating a training data set and a method for training a machine learning model20 Aug 2026US 2026/0246526 A1Carl Zeiss Microscopy GmbH
- Rapid mode switching of charged-particle-beam devices13 Aug 2026US 2026/0237595 A1
- Grids for electron microscopy and methods of manufacturing6 Aug 2026US 2026/0229448 A1Puxano BV
- Focused ion beam device and method of producing a sample piece using the same2 Jul 2026US 2026/0188607 A1Samsung Electronics Co., Ltd.
Most cited
By later US patents
- Low-energy scanning transmission electron microscope58US 4,618,767 AInternational Business Machines Corporation · 1986
- Electron microscope36US 5,866,905 AHitachi, Ltd. · 1999
- Particle optical system35US 9,349,571 B2Carl Zeiss Microscopy GmbH · 2016
- Method and apparatus for scanning transmission electron microscopy33US 6,531,697 B1Hitachi, Ltd. · 2003
- Electron microscope32US 6,051,834 AHitachi, Ltd. · 2000