Grids for electron microscopy and methods of manufacturing
AssigneePuxano BV
InventorsWouter VAN PUTTE, Marie-Aline MATTELIN, Benjamin HUET
Life of this patent
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Abstract
A grid (10) for use in electron microscopy to analyze samples (S), wherein said grid extends along a plane Po and comprises a mesh region (100) for receiving the samples and an edge region (200) surrounding said mesh region; wherein the mesh region is provided with one or more dome shaped relief regions (110) configured for holding the samples, said dome shaped relief regions extending out of the plane and being located at a distance from the edge region of the grid.
Claims20
A grid for use in electron microscopy to analyze samples, wherein said grid extends along a plane Po and comprises
- a mesh region for receiving the samples;
- and
- an edge region surrounding said mesh region;
- wherein the mesh region is provided with one or more dome shaped relief regions configured for holding the samples, said dome shaped relief regions extending out of the plane and being located at a distance from the edge region of the grid.
A method for manufacturing a grid for electron microscopy, the method comprising:
- providing a planar grid, said grid having a mesh region surrounded by an edge region;
- pressing of the mesh region against a relief or a mold so as to form a grid having one or more dome shaped relief regions within the mesh region at a distance of the edge region.
Dependencies are inferred from the claim text.