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AssigneeHitachi, Ltd.
InventorsHiroshi Kakibayashi, Yasuhiro Mitsui, Hideo Todokoro, Katsuhiro Kuroda, Masanari Koguchi, Kazutaka Tsuji, Tatsuo Makishima, Mikio Ichihashi, Shigeto Isakozawa, Ruriko Tsuneta, Kuniyasu Nakamura, Kensuke Sekihara, Jun Motoike
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3-dimensional observation on the atomic arrangement and atomic species in a thin-film specimen are carried out at high speed and accuracy by an electron microscope which measures electrons emitted at high angle from the specimen. A scanning transmission electron microscope has an electron detection device comprising a scintillator converting electrons detected thereby to photons, a photoconductive-film converting photons from the scintillator detected thereby to c.a. 1000 times as many electron-hole pairs as these photons.
An electron microscope system in which a first electron beam emitted from an electron source irradiates a sample from a predetermined direction, and a second electron beam emitted from said sample is detected by an electron beam detector, and in which an internal structure of said sample is displayed 3-dimensionally on a display employing signals of said second electron beam issued from said electron beam detector, wherein said first electron beam irradiates said sample from at least four predetermined directions.
An electron microscope system in which a first electron beam emitted from an electron source irradiates a sample in a scanning region of said first electron beam from a predetermined direction, and a second electron beam emitted from said sample is detected by an electron beam detector, and in which a 3-dimensional perspective image, a projection image, or a cross-sectional image of said sample is displayed on a display employing signals issued from said electron beam detector, wherein said first electron beam irradiates said sample from at least four predetermined directions.
Dependencies are inferred from the claim text.