H01J 2237/2566
Ion
Official title: ion
H01J2237/2566 (Ion) appears on 24 US grants and 22 published applications in this corpus.
Search patents in H01J- Granted patents
- 24
- Published applications
- 22
- Assignees
- 8
- Inventors
- 28
- Latest grant
- 19 Jul 2022
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 1 | 15 |
| 2008 | 0 | 0 |
| 2009 | 14 | 1 |
| 2010 | 1 | 2 |
| 2011 | 0 | 0 |
| 2012 | 2 | 1 |
| 2013 | 0 | 0 |
| 2014 | 1 | 1 |
| 2015 | 1 | 1 |
| 2016 | 1 | 0 |
| 2017 | 0 | 0 |
| 2018 | 0 | 0 |
| 2019 | 0 | 0 |
| 2020 | 0 | 0 |
| 2021 | 0 | 1 |
| 2022 | 1 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Ion generator device supports19 Jul 2022US 11,389,808 B2Plasma Air International, Inc
- Ion sources, systems and methods12 Jan 2016US 9,236,225 B2Carl Zeiss Microscopy GmbH
- Ion sources, systems and methods21 Apr 2015US 9,012,867 B2Carl Zeiss Microscopy GmbH
- Ion sources, systems and methods10 Jun 2014US 8,748,845 B2Carl Zeiss Microscopy GmbH
- Ion sources, systems and methods7 Feb 2012US 8,110,814 B2ALIS Corporation
- Ion generator device supports1 Jul 2021US 2021/0197208 A1Plasma Air International, Inc
- Ion sources, systems and methods30 Jul 2015US 2015/0213997 A1Carl Zeiss Microscopy GmbH
- Ion sources, systems and methods16 Oct 2014US 2014/0306121 A1Carl Zeiss Microscopy GmbH
- Ion sources, systems and methods7 Jun 2012US 2012/0141693 A1ALIS Corporation
- Device and method for crystal orientation measurement by means of an ion blocking pattern and a focused ion probe23 Sep 2010US 2010/0237242 A1
Most cited
By later US patents
- Ion sources, systems and methods93US 7,554,096 B2ALIS Corporation · 2009
- Ion sources, systems and methods67US 7,554,097 B2ALIS Corporation · 2009
- Ion sources, systems and methods65US 7,557,359 B2ALIS Corporation · 2009
- Ion sources, systems and methods64US 7,557,358 B2ALIS Corporation · 2009
- Ion sources, systems and methods63US 7,557,360 B2ALIS Corporation · 2009