H01J 2237/204
Means for introducing and/or outputting objects
H01J2237/204 (Means for introducing and/or outputting objects) appears on 252 US grants and 275 published applications in this corpus.
Search patents in H01J- Granted patents
- 252
- Published applications
- 275
- Assignees
- 115
- Inventors
- 636
- Latest grant
- 7 Jul 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 2 | 0 |
| 1994 | 1 | 0 |
| 1995 | 3 | 0 |
| 1996 | 6 | 0 |
| 1997 | 2 | 0 |
| 1998 | 5 | 0 |
| 1999 | 2 | 0 |
| 2000 | 3 | 0 |
| 2001 | 1 | 0 |
| 2002 | 2 | 9 |
| 2003 | 2 | 1 |
| 2004 | 1 | 5 |
| 2005 | 3 | 8 |
| 2006 | 10 | 10 |
| 2007 | 11 | 16 |
| 2008 | 11 | 12 |
| 2009 | 6 | 14 |
| 2010 | 9 | 13 |
| 2011 | 13 | 10 |
| 2012 | 8 | 6 |
| 2013 | 11 | 8 |
| 2014 | 13 | 10 |
| 2015 | 8 | 14 |
| 2016 | 10 | 9 |
| 2017 | 7 | 8 |
| 2018 | 3 | 9 |
| 2019 | 11 | 10 |
| 2020 | 17 | 14 |
| 2021 | 11 | 16 |
| 2022 | 13 | 18 |
| 2023 | 11 | 15 |
| 2024 | 14 | 16 |
| 2025 | 14 | 12 |
| 2026 | 7 | 12 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Substrate analysis system7 Jul 2026US 12,676,288 B2Samsung Electronics Co., Ltd.
- Sample holder and electron microscope26 May 2026US 12,640,336 B2Hitachi, Ltd.
- Sample holder, loading device, and method for inserting a sample into a sample holder21 Apr 2026US 12,609,267 B2Leica Microsystems CMS GmbH
- Workstation, preparation station and method for manipulating an electron microscopy grid assembly17 Mar 2026US 12,580,149 B2Max-Planck-Gesellschaft Zur FöRderung Der Wissenschaften E. V.
- System of scanning electron microscope sample box and method of opening the same10 Mar 2026US 12,573,583 B2University of Science and Technology of China
- Improved plasma products and methods for producing same by using multiple simultaneous electrical discharges24 Sep 2026US 2026/0290760 A1Plazer IP, LLC
- Charged Particle Beam System and Control Method Therefor10 Sep 2026US 2026/0269173 A1Hitachi High-Tech Corporation
- Charged Particle Beam Device and Method for Producing and Observing Sample Piece6 Aug 2026US 2026/0229446 A1Hitachi High-Tech Corporation
- Charged Particle Beam Device30 Jul 2026US 2026/0221377 A1Hitachi High-Tech Corporation
- Conveying Method, Conveyance Device, and Analysis System30 Jul 2026US 2026/0221378 A1Hitachi High-Tech Corporation
Most cited
By later US patents
- Electron beam inspection system and method257US 5,502,306 AKLA Instruments Corporation · 1996
- Method for inspecting substrate, substrate inspecting system and electron beam apparatus113US 7,109,483 B2Ebara Corporation · 2006
- Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using former61US 6,855,929 B2Ebara Corporation · 2005
- Electron beam apparatus and method of manufacturing semiconductor device using the apparatus56US 6,593,152 B2Ebara Corporation · 2003
- System for analyzing surfaces of samples47US 5,619,035 ABiotechnology Research and Development Corporation · 1997