Workstation, preparation station and method for manipulating an electron microscopy grid assembly

A workstation (1) for manipulating an electron microscopy grid assembly (3), comprising

• a first compartment (101),
• a first gas inlet (102) for providing a gas flow (G) of a dry gas from a gas reservoir (103) into the first compartment (101), wherein the workstation (1) is configured such that an overpressure can be generated in the first compartment (101) relative to an exterior of the workstation (1) by the gas flow (G),
• a first glove (104) and a second glove (105), each being fixed in a respective opening (106, 107) of the workstation (1) wherein the first glove (104) and the second glove (105) are configured such that a respective hand of a user may be inserted into the first glove (104) or second glove (105) from the exterior, wherein the first glove (104) and the second glove (105) are movable in the first compartment (101) to manipulate objects in the first compartment (101) using the respective hand of the user,
• wherein
• the workstation (1) comprises a port (109) for providing a transfer device (4) for an electron microscopy grid assembly (3) in the first compartment (101) from the exterior, to insert the electron microscopy grid assembly (3) into the transfer device (4) or remove the electron microscopy grid assembly (3) from the transfer device (4) in the first compartment (101), and wherein the workstation (1) comprises a pump inlet (125), wherein the pump inlet (125) is configured to be connected to a vacuum pump (124), wherein the vacuum pump (124) is configured to evacuate a chamber (41) of the transfer device (4) when the transfer device (4) is arranged in the port (109) of the workstation (1).