H01J 2237/152
Magnetic means
H01J2237/152 (Magnetic means) appears on 169 US grants and 178 published applications in this corpus.
Search patents in H01J- Granted patents
- 169
- Published applications
- 178
- Assignees
- 98
- Inventors
- 390
- Latest grant
- 15 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1986 | 1 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 1 | 0 |
| 1992 | 1 | 0 |
| 1993 | 1 | 0 |
| 1994 | 1 | 0 |
| 1995 | 1 | 0 |
| 1996 | 3 | 0 |
| 1997 | 1 | 0 |
| 1998 | 4 | 0 |
| 1999 | 1 | 0 |
| 2000 | 1 | 0 |
| 2001 | 1 | 2 |
| 2002 | 2 | 1 |
| 2003 | 2 | 3 |
| 2004 | 2 | 1 |
| 2005 | 1 | 4 |
| 2006 | 5 | 6 |
| 2007 | 1 | 3 |
| 2008 | 3 | 11 |
| 2009 | 6 | 4 |
| 2010 | 6 | 6 |
| 2011 | 6 | 3 |
| 2012 | 4 | 2 |
| 2013 | 1 | 4 |
| 2014 | 5 | 7 |
| 2015 | 8 | 9 |
| 2016 | 12 | 13 |
| 2017 | 6 | 6 |
| 2018 | 6 | 10 |
| 2019 | 12 | 14 |
| 2020 | 14 | 17 |
| 2021 | 12 | 4 |
| 2022 | 11 | 15 |
| 2023 | 8 | 5 |
| 2024 | 8 | 8 |
| 2025 | 6 | 10 |
| 2026 | 5 | 10 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Permeance magnetic assembly15 Sep 2026US 12,738,468 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Magnetic multipole device, charged particle beam apparatus, and method of influencing a charged particle beam propagating along an optical axis16 Jun 2026US 12,658,402 B2ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Multiple particle beam system with a contrast correction lens system14 Apr 2026US 12,603,245 B2Carl Zeiss MultiSEM GmbH
- Method of determining an energy spectrum or energy width of a charged particle beam, and charged particle beam imaging device24 Feb 2026US 12,562,338 B2ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Charged particle optics, charged particle beam apparatus, and method for scanning a charged particle beam3 Feb 2026US 12,542,253 B2ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Aberration correction reflector apparatus, aberration correction system, and method thereof17 Sep 2026US 2026/0279721 A1Quantum Science Center of Guangdong-Hongkong-Macao Greater Bay Area
- Multipole magnet adjustment system and multipole magnet adjustment method13 Aug 2026US 2026/0237591 A1Kabushiki Kaisha Toshiba
- Split objective lens for electron beam to enhance topographical imaging2 Jul 2026US 2026/0188603 A1
- Substrate processing apparatus including electromagnet unit2 Jul 2026US 2026/0188629 A1Semes Co., Ltd.
- Collation system28 May 2026US 2026/0148929 A1NEC Corporation
Most cited
By later US patents
- Electromagnet and magnetic field generating apparatus109US 6,365,894 B2Hitachi, Ltd. · 2002
- Electromagnet and magnetic field generating apparatus108US 6,236,043 B1Hitachi, Ltd. · 2001
- Beam tuning with automatic magnet pole rotation for ion implanters43US 7,476,855 B2Axcelis Technologies, Inc. · 2009
- Charged particle beam treatment apparatus and method of adjusting path length of charged particle beam23US 9,142,385 B1Sumitomo Heavy Industries, Ltd. · 2015
- Electromagnetic deflector18US 5,994,704 ANikon Corporation · 1999