H01J 2237/0264
Magnetic
Official title: magnetic
H01J2237/0264 (Magnetic) appears on 53 US grants and 69 published applications in this corpus.
Search patents in H01J- Granted patents
- 53
- Published applications
- 69
- Assignees
- 42
- Inventors
- 179
- Latest grant
- 14 Jul 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 1 | 0 |
| 1994 | 0 | 0 |
| 1995 | 3 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 4 |
| 2003 | 0 | 1 |
| 2004 | 3 | 2 |
| 2005 | 1 | 0 |
| 2006 | 0 | 2 |
| 2007 | 0 | 0 |
| 2008 | 2 | 0 |
| 2009 | 0 | 1 |
| 2010 | 0 | 0 |
| 2011 | 1 | 3 |
| 2012 | 0 | 2 |
| 2013 | 1 | 5 |
| 2014 | 2 | 5 |
| 2015 | 7 | 7 |
| 2016 | 4 | 2 |
| 2017 | 4 | 4 |
| 2018 | 2 | 4 |
| 2019 | 3 | 4 |
| 2020 | 3 | 4 |
| 2021 | 2 | 1 |
| 2022 | 4 | 4 |
| 2023 | 1 | 4 |
| 2024 | 3 | 4 |
| 2025 | 1 | 5 |
| 2026 | 3 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Ion microscope14 Jul 2026US 12,683,113 B2National University of Singapore
- Adjustable permanent magnetic lens having shunting device30 Jun 2026US 12,671,054 B2IMS Nanofabrication GmbH
- Charged-particle detector package for high speed applications21 Apr 2026US 12,610,629 B2ASML Netherlands B. V.
- Aberration correction in charged particle system12 Aug 2025US 12,387,903 B2ASML Netherlands B. V.
- Dual source injector with switchable analyzing magnet8 Oct 2024US 12,112,918 B2Axcelis Technologies, Inc.
- Multiple particle beam system, in particular multi-beam particle microscope, having a fast magnetic lens and the use thereof2 Apr 2026US 2026/0094783 A1
- Magnetic shielding of the photomultiplier in the magnetic immersion field4 Dec 2025US 2025/0372340 A1FEI Company
- Protecting a detector while discharging a region of a sample9 Oct 2025US 2025/0316439 A1Applied Materials Israel Ltd.
- Sample inspection system25 Sep 2025US 2025/0299902 A1Hitachi High-Tech Corporation
- A multi-mode low-voltage electron microscope10 Jul 2025US 2025/0226173 A1Delong Instruments A.S.
Most cited
By later US patents
- Information recording apparatus having magnetic shield means14US 5,446,722 APioneer Electronic Corporation · 1995
- Localized vacuum processing apparatus12US 4,524,261 AVarian Associates, Inc. · 1985
- Scanning electron microscope9US 5,448,064 AHitachi, Ltd. · 1995
- Active magnetic shielding9US 6,846,396 B2APPLIED Materials.Inc. · 2005
- Magnetically shielded high voltage electron accelerator8US 5,463,268 ANational Electrostatics Corp. · 1995