G11C 29/883
Using a single defective memory device with reduced capacity
Official title: {using a single defective memory device with reduced capacity, e.g. half capacity}
G11C29/883 (Using a single defective memory device with reduced capacity) appears on 212 US grants and 240 published applications in this corpus.
Search patents in G11C- Granted patents
- 212
- Published applications
- 240
- Assignees
- 94
- Inventors
- 467
- Latest grant
- 25 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1999 | 2 | 0 |
| 2000 | 0 | 0 |
| 2001 | 6 | 1 |
| 2002 | 4 | 3 |
| 2003 | 2 | 13 |
| 2004 | 6 | 5 |
| 2005 | 8 | 8 |
| 2006 | 5 | 10 |
| 2007 | 6 | 6 |
| 2008 | 4 | 5 |
| 2009 | 8 | 6 |
| 2010 | 7 | 5 |
| 2011 | 3 | 9 |
| 2012 | 2 | 10 |
| 2013 | 12 | 11 |
| 2014 | 10 | 2 |
| 2015 | 6 | 7 |
| 2016 | 5 | 4 |
| 2017 | 4 | 6 |
| 2018 | 4 | 11 |
| 2019 | 11 | 17 |
| 2020 | 13 | 14 |
| 2021 | 16 | 20 |
| 2022 | 16 | 19 |
| 2023 | 23 | 14 |
| 2024 | 14 | 12 |
| 2025 | 11 | 15 |
| 2026 | 4 | 7 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Memory circuit with memory cells having bistable circuit and non-volatile element25 Aug 2026US 12,718,873 B2Japan Science and Technology Agency
- Wordline group-based identification of good memory blocks during a programming operation18 Aug 2026US 12,711,055 B2Micron Technology, Inc.
- Memory device27 Jan 2026US 12,537,070 B2Semiconductor Energy Laboratory Co.Ltd.
- Memory with post-packaging master die selection13 Jan 2026US 12,524,342 B2Micron Technology, Inc.
- Operation method of memory, memory and memory system7 Oct 2025US 12,437,834 B2Yangtze Memory Technologies Co., Ltd.
- Memory with post-packaging master die selection14 May 2026US 2026/0133906 A1Micron Technology, Inc.
- Logic-based defective memory component screening14 May 2026US 2026/0134940 A1Micron Technology, Inc.
- Memory fault processing method and apparatus, electronic device, and readable storage medium30 Apr 2026US 2026/0120787 A1Huawei Technologies Co., Ltd.
- Storage controller for detecting failure of nonvolatile memory device, storage device including the storage controller, and electronic system including the storage device23 Apr 2026US 2026/0112439 A1Samsung Electronics Co., Ltd.
- Maintenance-based conditions for block retirement2 Apr 2026US 2026/0094655 A1Micron Technology, Inc.
Most cited
By later US patents
- Disabling faulty flash memory dies50US 7,609,561 B2Apple Inc. · 2009
- Terminal mapping apparatus41US 5,987,623 AOki Electric Industry Co., Ltd. · 1999
- Controller and method for virtual LUN assignment for improved memory bank mapping31US 8,700,961 B2SanDisk Technologies LLC · 2014
- Address converter apparatus and method to support various kinds of memory chips and application system thereof29US 6,754,797 B2Leadtek Research Inc. · 2004
- Systems and methods for generating dynamic super blocks27US 8,832,507 B2Apple Inc. · 2014