Memory device
AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsTakanori Matsuzaki, Tatsuya Onuki, Takeshi Aoki
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AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsTakanori Matsuzaki, Tatsuya Onuki, Takeshi Aoki
Estimating the term…
A highly reliable memory device is provided. The memory device includes a memory control unit that includes an input/output unit, a control unit, and a first management unit and a memory unit that includes a plurality of memory blocks. The first management unit includes a plurality of first memory elements, the control unit has a function of converting an address input through the input/output unit to an address of the memory block corresponding to the address, with use of a first management table retained in the plurality of first memory elements, and the first memory elements each include a ferroelectric. The control portion may include a function of not using a defective memory cell and may have a function of performing error correction of readout data.
A memory device comprising:
Dependencies are inferred from the claim text.