Logic-based defective memory component screening

A non-transitory computer-readable storage medium comprising instructions that, when executed by a processing device, cause the processing device to:

• read a defective byte map of memory having separately accessible chunks of memory, each chunk of memory having a number of bytes addressable in a physical domain and a logical domain, and wherein each chunk of the memory is allocated a number of bytes to repair defective bytes;
• map a number of defective bytes in a chunk of a memory in the physical domain to a number of sub-segments of the memory in the logical domain;
• and
• write, to a portion of the memory, an address of a defective byte in the chunk of the memory for repair in response to determining that an available number of bytes allocated to repair defective bytes satisfies a number of defective bytes in a sub-segment of the number of sub-segments of the memory in the logical domain.

A system comprising:

• a plurality of memory devices;
• and
• a processing device, operatively coupled with the plurality of memory devices, to:
• read a defective byte map of memory having separately accessible chunks of memory, each chunk of memory having a number of bytes addressable in a physical domain and a logical domain, and wherein each chunk of the memory is allocated a number of bytes to repair defective bytes;
• map a number of defective bytes in a chunk of a memory in the physical domain to a number of sub-segments of the memory in the logical domain;
• and
• map an address of a defective byte in the chunk of memory to an address of a redundant byte of memory by writing, to a portion of the memory, the address of the defective byte in the chunk of the memory for repair and the address of the redundant memory, in response to determining that an available number of bytes allocated to repair defective bytes satisfies a number of defective bytes in a sub-segment of the number of sub-segments of the memory in the logical domain.