G01R 31/318591
Tools
Official title: {Tools}
G01R31/318591 (Tools) appears on 74 US grants and 54 published applications in this corpus.
Search patents in G01R- Granted patents
- 74
- Published applications
- 54
- Assignees
- 43
- Inventors
- 164
- Latest grant
- 3 Feb 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1996 | 3 | 0 |
| 1997 | 1 | 0 |
| 1998 | 2 | 0 |
| 1999 | 1 | 0 |
| 2000 | 4 | 0 |
| 2001 | 4 | 0 |
| 2002 | 1 | 4 |
| 2003 | 6 | 2 |
| 2004 | 1 | 4 |
| 2005 | 1 | 3 |
| 2006 | 3 | 3 |
| 2007 | 6 | 1 |
| 2008 | 3 | 7 |
| 2009 | 4 | 5 |
| 2010 | 6 | 2 |
| 2011 | 2 | 1 |
| 2012 | 1 | 2 |
| 2013 | 1 | 1 |
| 2014 | 4 | 3 |
| 2015 | 3 | 2 |
| 2016 | 1 | 0 |
| 2017 | 1 | 1 |
| 2018 | 3 | 2 |
| 2019 | 1 | 3 |
| 2020 | 2 | 2 |
| 2021 | 3 | 1 |
| 2022 | 1 | 1 |
| 2023 | 2 | 0 |
| 2024 | 0 | 3 |
| 2025 | 2 | 1 |
| 2026 | 1 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Systems and methods with auxiliary control boards having interface devices3 Feb 2026US 12,541,235 B2Altera Corporation
- Self-functional detection system for tap controller and method thereof22 Jul 2025US 12,366,606 B2Inventec Corporation
- Processing devices for reducing scan traffic, method and computer program17 Jun 2025US 12,332,308 B2Intel Corporation
- Scan apparatus capable of fault diagnosis and scan chain fault diagnosis method31 Jan 2023US 11,567,132 B2UIF (University Industry Foundation), Yonsei University
- JTAG bus communication method and apparatus10 Jan 2023US 11,549,982 B2Texas Instruments Incorporated
- Self-functional detection system for tap controller and method thereof12 Jun 2025US 2025/0189582 A1Inventec Corporation
- Systems And Methods With Auxiliary Control Boards Having Interface Devices28 Nov 2024US 2024/0393848 A1Intel Corporation
- Electronic device and method of testing electronic device27 Jun 2024US 2024/0210471 A1Samsung Electronics Co., Ltd.
- Processing Devices for reducing scan traffic, Method and Computer Program16 May 2024US 2024/0159829 A1Intel Corporation
- Scan apparatus capable of fault diagnosis and scan chain fault diagnosis method1 Dec 2022US 2022/0381825 A1UIF (University Industry Foundation), Yonsei University
Most cited
By later US patents
- Method for manufacturing test simulation in electronic circuit design195US 5,539,652 AHewlett-Packard Company · 1996
- Method and apparatus for performing fully visible tracing of an emulation116US 5,754,827 AMentor Graphics Corporation · 1998
- Boundary-scan method using object-oriented programming language84US 6,195,774 B1Xilinx, Inc. · 2001
- Instruction signature and primary input and primary output extraction within an IEEE 1149.1 compliance checker75US 6,449,755 B1Synopsys, Inc. · 2002
- Method and apparatus for debug, diagnosis, and yield improvement of scan-based integrated circuits68US 7,058,869 B2Syntest Technologies, Inc. · 2006