Scan apparatus capable of fault diagnosis and scan chain fault diagnosis method
AssigneeUIF (University Industry Foundation), Yonsei University
InventorsSungho Kang, Seokjun Jang
Life of this patent
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Abstract
Provided are scan device and method of diagnosing scan chain fault. The scan device for diagnosing a fault includes a scan partition including a plurality of scan chains which include path control scan flipflops connected to scan flipflops in cascade. In the scan partition, connection paths of the scan flipflops are controllable. The connection paths of the path control scan flipflops are controlled to detect a position of a fault such that a fault range in the scan partition is reduced to diagnose the fault.
Claims16
A scan device comprising a scan partition including a plurality of scan chains which include path control scan flipflops connected to scan flipflops in cascade,
- wherein connection paths of the scan flipflops in the scan partition are controllable, and
- the connection paths of the path control scan flipflops are controlled to detect a position of a fault such that a fault range in the scan partition is reduced to diagnose the fault.
A method of diagnosing a scan chain fault, the method comprising:
- a first phase of changing connection paths of path control scan flipflops to reduce a fault range in a scan partition, which includes a plurality of scan chains including the path control scan flipflops connected to simple scan flipflops in cascade, and detect a fault;
- and
- a second phase in which the path control scan flipflops are connected to connection paths, which have not been changed in the first phase, according to a result of the first phase to detect a position of the fault in the scan partition.
Dependencies are inferred from the claim text.