G01R 31/318378
Of patterns for devices arranged in a network
Official title: {of patterns for devices arranged in a network}
G01R31/318378 (Of patterns for devices arranged in a network) appears on 42 US grants and 19 published applications in this corpus.
Search patents in G01R- Granted patents
- 42
- Published applications
- 19
- Assignees
- 21
- Inventors
- 73
- Latest grant
- 19 Dec 2023
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 6 | 0 |
| 1997 | 2 | 0 |
| 1998 | 2 | 0 |
| 1999 | 0 | 0 |
| 2000 | 2 | 0 |
| 2001 | 5 | 0 |
| 2002 | 1 | 0 |
| 2003 | 3 | 3 |
| 2004 | 2 | 3 |
| 2005 | 2 | 2 |
| 2006 | 2 | 0 |
| 2007 | 4 | 3 |
| 2008 | 2 | 0 |
| 2009 | 1 | 1 |
| 2010 | 0 | 1 |
| 2011 | 1 | 1 |
| 2012 | 0 | 1 |
| 2013 | 1 | 0 |
| 2014 | 0 | 1 |
| 2015 | 1 | 0 |
| 2016 | 0 | 0 |
| 2017 | 0 | 0 |
| 2018 | 0 | 1 |
| 2019 | 1 | 0 |
| 2020 | 0 | 0 |
| 2021 | 1 | 0 |
| 2022 | 0 | 1 |
| 2023 | 1 | 0 |
| 2024 | 0 | 0 |
| 2025 | 0 | 1 |
By publication year. Applications have been published since 2001.
Recent patents
- Method and device for testing system-on-chip, electronic device using method, and computer readable storage medium19 Dec 2023US 11,846,672 B2Hon Hai Precision Industry Co., Ltd.
- Equivalent time network analyzer25 May 2021US 11,016,146 B2Massachusetts Institute of Technology
- Test network for a network on a chip and a configuration network10 Dec 2019US 10,502,785 B1Xilinx, Inc.
- Panel driving circuit that generates panel test pattern and panel test method thereof3 Mar 2015US 8,972,811 B2Samsung Electronics Co., Ltd.
- Panel driving circuit that generates panel test pattern and panel test method thereof31 Dec 2013US 8,621,306 B2Samsung Electronics Co., Ltd.
- Apparatus and method for performing a network diagnosis procedure19 Jun 2025US 2025/0199067 A1NXP B. V.
- Method and device for testing system-on-chip, electronic device using method, and computer readable storage medium5 May 2022US 2022/0137125 A1Hon Hai Precision Industry Co., Ltd.
- Equivalent Time Network Analyzer4 Oct 2018US 2018/0284191 A1Massachusetts Institute of Technology
- Panel driving circuit that generates panel test pattern and panel test method thereof27 Mar 2014US 2014/0089753 A1Samsung Electronics Co., Ltd.
- Panel Driving Circuit That Generates Panel Test Pattern and Panel Test Method Thereof22 Mar 2012US 2012/0072773 A1Samsung Electronics Co., Ltd.
Most cited
By later US patents
- Method and system for creating, deriving and validating structural description of electronic system from higher level, behavior-oriented description, including interactive schematic design and simulation252US 5,544,067 ALSI Logic Corporation · 1996
- System and method for creating and validating structural description of electronic system219US 5,623,418 ALSI Logic Corporation · 1997
- Method and system for creating and validating low level description of electronic design from higher level, behavior-oriented description, including estimation and comparison of timing parameters181US 5,541,849 ALSI Logic Corporation · 1996
- Method and system for creating and validating low level description of electronic design160US 6,324,678 B1LSI Logic Corporation · 2001
- Method and system for creating, deriving and validating structural description of electronic system from higher level, behavior-oriented description, including interactive schematic design and simulation138US 6,470,482 B1LSI Logic Corporation · 2002