Method and device for testing system-on-chip, electronic device using method, and computer readable storage medium
AssigneeHon Hai Precision Industry Co., Ltd.
InventorJUN-KUI HUANG
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Abstract
A method for testing systems on a chip during manufacture obtains basic function information of intellectual property cores and relevant information of network on chip and generates one or more test names according to the basic function information, and the relevant information of the network on chip. The method invokes a pre-prepared integral script to construct a running environment configured to invoke basic function scripts of to-be-tested intellectual property cores one by one, according to each of the test names which are generated. The method also generates the results of testing. A related electronic device and a non-transitory storage medium are also disclosed.
Claims20
A method for applying tests comprising:
- obtaining basic function information of intellectual property cores and relevant information of network on chip;
- generating one or more test names according to the basic function information of the intellectual property cores and the relevant information of the network on chip;
- invoking an integral script to construct a running environment configured to invoke basic function scripts of to-be-tested intellectual property cores one by one, according to each of the test names which are generated;
- and
- generating results of testing.
An electronic device comprising:
- a storage device;
- at least one processor;
- and
- the storage device storing one or more programs, which when executed by the at least one processor, cause the at least one processor to:
- obtain basic function information of intellectual property cores and relevant information of network on chip;
- generate one or more test names according to the basic function information of the intellectual property cores and the relevant information of the network on chip;
- invoke an integral script to construct a running environment configured to invoke basic function scripts of to-be-tested intellectual property cores one by one, according to each of the test names which are generated;
- generate results of testing.
A non-transitory storage medium storing a set of commands, when the commands being executed by at least one processor of an electronic device, causing the at least one processor to:
- obtain basic function information of intellectual property cores and relevant information of network on chip;
- generate one or more test names according to the basic function information of the intellectual property cores and the relevant information of the network on chip;
- invoke an integral script to construct a running environment configured to invoke basic function scripts of to-be-tested intellectual property cores one by one, according to each of the test names which are generated;
- generate results of testing.
Dependencies are inferred from the claim text.